Effect of reverse body bias on hot-electron-induced punchthrough reliability of pMOSFETs with thin gate dielectric at high temperatures

Yong Ha Kang, Jong Kyun Kim, Nam Hyun Lee, Min Geon Oh, Yu Chul Hwang, Byung-Moo Moon

Research output: Contribution to journalArticlepeer-review

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Engineering & Materials Science

Physics & Astronomy