Effect of surface treatment of substrate on field emission characteristics of carbon nanotubes

Keunsoo Lee, Yang Doo Lee, Byung Hyun Kang, Ki Young Dong, Won Seok Kim, Byeong Kwon Ju

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The field emission characteristics of patterned carbon nanotubes whose average diameter is 16nm cathodes on substrates with surface treatment were investigated. The surface treatment of the substrate was performed by nickel electroless plating. Carbon nanotubes were patterned on the surface treated substrate with radius of 200μm through conventional photolithography process. It was revealed that the different surface morphologies of the substrates have influence on the field emission characteristics in this study. Through the surface treatment, the roughness of the surface increased and cathode with a high roughness factor showed better field emission characteristics compared to non-treated ones.

Original languageEnglish
Title of host publication2012 IEEE International Conference on Electron Devices and Solid State Circuit, EDSSC 2012
DOIs
Publication statusPublished - 2012
Event2012 8th IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2012 - Bangkok, Thailand
Duration: 2012 Dec 32012 Dec 5

Publication series

Name2012 IEEE International Conference on Electron Devices and Solid State Circuit, EDSSC 2012

Other

Other2012 8th IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2012
CountryThailand
CityBangkok
Period12/12/312/12/5

Keywords

  • Carbon nanotubes
  • Field emission
  • surface treatment

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

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    Lee, K., Lee, Y. D., Kang, B. H., Dong, K. Y., Kim, W. S., & Ju, B. K. (2012). Effect of surface treatment of substrate on field emission characteristics of carbon nanotubes. In 2012 IEEE International Conference on Electron Devices and Solid State Circuit, EDSSC 2012 [6482778] (2012 IEEE International Conference on Electron Devices and Solid State Circuit, EDSSC 2012). https://doi.org/10.1109/EDSSC.2012.6482778