Effect of Te inclusions in CdZnTe crystals at different temperatures

A. Hossain; A. E. Bolotnikov; G. S. Camarda; R. Gul; Kihyun Kim; Y. Cui; G. Yang; L. Xu; R. B. James

doi:10.1063/1.3549236

Effect of Te inclusions in CdZnTe crystals at different temperatures

A. Hossain, A. E. Bolotnikov, G. S. Camarda, R. Gul, Kihyun Kim, Y. Cui, G. Yang, L. Xu, R. B. James

Research output: Contribution to journal › Article

9 Citations (Scopus)

Abstract

CdZnTe crystals often exhibit nonuniformities due to the presence of Te inclusions and dislocations. High concentrations of such defects in these crystals generally entail severe charge-trapping, a major problem in ensuring the device's satisfactory performance. In this study, we employed a high-intensity, high-spatial-resolution synchrotron x-ray beam as the ideal tool to generate charges by focusing it over the large Te inclusions, and then observing the carrier's response at room- and at low-temperatures. A high spatial 5-μm resolution raster scan revealed the fine details of the presence of extended defects, like Te inclusions and dislocations in the CdZnTe crystals. A noticeable change was observed in the efficiency of electron charge collection at low temperature (1 °C), but it was hardly altered at room-temperature.

Original language	English
Article number	044504
Journal	Journal of Applied Physics
Volume	109
Issue number	4
DOIs	https://doi.org/10.1063/1.3549236
Publication status	Published - 2011 Feb 15
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy(all)

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Hossain, A., Bolotnikov, A. E., Camarda, G. S., Gul, R., Kim, K., Cui, Y., Yang, G., Xu, L., & James, R. B. (2011). Effect of Te inclusions in CdZnTe crystals at different temperatures. Journal of Applied Physics, 109(4), [044504]. https://doi.org/10.1063/1.3549236

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abstract = "CdZnTe crystals often exhibit nonuniformities due to the presence of Te inclusions and dislocations. High concentrations of such defects in these crystals generally entail severe charge-trapping, a major problem in ensuring the device's satisfactory performance. In this study, we employed a high-intensity, high-spatial-resolution synchrotron x-ray beam as the ideal tool to generate charges by focusing it over the large Te inclusions, and then observing the carrier's response at room- and at low-temperatures. A high spatial 5-μm resolution raster scan revealed the fine details of the presence of extended defects, like Te inclusions and dislocations in the CdZnTe crystals. A noticeable change was observed in the efficiency of electron charge collection at low temperature (1 °C), but it was hardly altered at room-temperature.",

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AU - Hossain, A.

AU - Bolotnikov, A. E.

AU - Camarda, G. S.

AU - Gul, R.

AU - Kim, Kihyun

AU - Cui, Y.

AU - Yang, G.

AU - Xu, L.

AU - James, R. B.

PY - 2011/2/15

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