Effect of temperature and humidity on the degradation rate of multicrystalline silicon photovoltaic module

N. C. Park, W. W. Oh, Donghwan Kim

Research output: Contribution to journalArticle

29 Citations (Scopus)

Abstract

In a PV module, the relative humidity (rh) of a front encapsulant is different from that of a backside encapsulant (rhback). In this study, the effective humidity (rheff) in a PV module was investigated to study the effects of moisture variation on the degradation rate (R D). rheff represents uniform humidity in a PV module when it is exposed to certain damp heat conditions. Five types of accelerated tests were conducted to derive the relation between rheff and rhback. rh eff showed a linear relationship with rhback at constant temperature. Two types of models, namely, Eyring and Peck models, were used for predicting the R D of PV modules, and their results were compared. The R D of PV modules was thermally activated at 0.49 eV. Furthermore, the temperature and rheff history of PV modules over one year were determined at two locations: Miami (FL, USA) and Phoenix (AZ, USA). The accumulated R D values based on the temperature and rheff of the modules were calculated by summing the hourly degradation amounts over the time history.

Original languageEnglish
Article number925280
JournalInternational Journal of Photoenergy
Volume2013
DOIs
Publication statusPublished - 2013 Dec 1

Fingerprint

Silicon
humidity
Atmospheric humidity
modules
degradation
Degradation
silicon
Temperature
temperature
histories
Moisture
Phoenix (AZ)
moisture
heat

ASJC Scopus subject areas

  • Renewable Energy, Sustainability and the Environment
  • Chemistry(all)
  • Atomic and Molecular Physics, and Optics
  • Materials Science(all)

Cite this

Effect of temperature and humidity on the degradation rate of multicrystalline silicon photovoltaic module. / Park, N. C.; Oh, W. W.; Kim, Donghwan.

In: International Journal of Photoenergy, Vol. 2013, 925280, 01.12.2013.

Research output: Contribution to journalArticle

@article{d911643af5d445588c7c0aaf2e290d5b,
title = "Effect of temperature and humidity on the degradation rate of multicrystalline silicon photovoltaic module",
abstract = "In a PV module, the relative humidity (rh) of a front encapsulant is different from that of a backside encapsulant (rhback). In this study, the effective humidity (rheff) in a PV module was investigated to study the effects of moisture variation on the degradation rate (R D). rheff represents uniform humidity in a PV module when it is exposed to certain damp heat conditions. Five types of accelerated tests were conducted to derive the relation between rheff and rhback. rh eff showed a linear relationship with rhback at constant temperature. Two types of models, namely, Eyring and Peck models, were used for predicting the R D of PV modules, and their results were compared. The R D of PV modules was thermally activated at 0.49 eV. Furthermore, the temperature and rheff history of PV modules over one year were determined at two locations: Miami (FL, USA) and Phoenix (AZ, USA). The accumulated R D values based on the temperature and rheff of the modules were calculated by summing the hourly degradation amounts over the time history.",
author = "Park, {N. C.} and Oh, {W. W.} and Donghwan Kim",
year = "2013",
month = "12",
day = "1",
doi = "10.1155/2013/925280",
language = "English",
volume = "2013",
journal = "International Journal of Photoenergy",
issn = "1110-662X",
publisher = "Hindawi Publishing Corporation",

}

TY - JOUR

T1 - Effect of temperature and humidity on the degradation rate of multicrystalline silicon photovoltaic module

AU - Park, N. C.

AU - Oh, W. W.

AU - Kim, Donghwan

PY - 2013/12/1

Y1 - 2013/12/1

N2 - In a PV module, the relative humidity (rh) of a front encapsulant is different from that of a backside encapsulant (rhback). In this study, the effective humidity (rheff) in a PV module was investigated to study the effects of moisture variation on the degradation rate (R D). rheff represents uniform humidity in a PV module when it is exposed to certain damp heat conditions. Five types of accelerated tests were conducted to derive the relation between rheff and rhback. rh eff showed a linear relationship with rhback at constant temperature. Two types of models, namely, Eyring and Peck models, were used for predicting the R D of PV modules, and their results were compared. The R D of PV modules was thermally activated at 0.49 eV. Furthermore, the temperature and rheff history of PV modules over one year were determined at two locations: Miami (FL, USA) and Phoenix (AZ, USA). The accumulated R D values based on the temperature and rheff of the modules were calculated by summing the hourly degradation amounts over the time history.

AB - In a PV module, the relative humidity (rh) of a front encapsulant is different from that of a backside encapsulant (rhback). In this study, the effective humidity (rheff) in a PV module was investigated to study the effects of moisture variation on the degradation rate (R D). rheff represents uniform humidity in a PV module when it is exposed to certain damp heat conditions. Five types of accelerated tests were conducted to derive the relation between rheff and rhback. rh eff showed a linear relationship with rhback at constant temperature. Two types of models, namely, Eyring and Peck models, were used for predicting the R D of PV modules, and their results were compared. The R D of PV modules was thermally activated at 0.49 eV. Furthermore, the temperature and rheff history of PV modules over one year were determined at two locations: Miami (FL, USA) and Phoenix (AZ, USA). The accumulated R D values based on the temperature and rheff of the modules were calculated by summing the hourly degradation amounts over the time history.

UR - http://www.scopus.com/inward/record.url?scp=84893865963&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84893865963&partnerID=8YFLogxK

U2 - 10.1155/2013/925280

DO - 10.1155/2013/925280

M3 - Article

AN - SCOPUS:84893865963

VL - 2013

JO - International Journal of Photoenergy

JF - International Journal of Photoenergy

SN - 1110-662X

M1 - 925280

ER -