Effect of thermal fluctuations on switching field of deep submicron sized soft magnetic thin film

Kyoung Jin Lee, T. D. Lee

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

In this article, the effect of thermal fluctuations on switching field at short and long time scales have been investigated by micromagnetic simulation with the Langevin and the time-temperature scaling methods. When the film thickness and/or the aspect ratio are reduced, the switching field decreases substantially owing to the decrease of shape anisotropy and the increase of thermal fluctuation. In the soft magnetic film with a dimension of 0.4μm×0.2μm×1nm, the calculated switching field at a pulse width of 10 ns is 32 Oe, but estimated retention time is less than 1000 s. In such a thermally unstable film, thermally activated switching of magnetization occurs by complex behaviors with creations and annihilations of small and slightly tilted magnetic clusters.

Original languageEnglish
Pages (from-to)7706-7708
Number of pages3
JournalJournal of Applied Physics
Volume91
Issue number10 I
DOIs
Publication statusPublished - 2002 May 15
Externally publishedYes

Fingerprint

thin films
magnetic films
aspect ratio
pulse duration
film thickness
scaling
magnetization
anisotropy
simulation
temperature

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Effect of thermal fluctuations on switching field of deep submicron sized soft magnetic thin film. / Lee, Kyoung Jin; Lee, T. D.

In: Journal of Applied Physics, Vol. 91, No. 10 I, 15.05.2002, p. 7706-7708.

Research output: Contribution to journalArticle

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