Effective automatic defect classification process based on CNN with stacking ensemble model for TFT-LCD panel

Myeongso Kim, Minyoung Lee, Minjeong An, Hongchul Lee

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)

Fingerprint Dive into the research topics of 'Effective automatic defect classification process based on CNN with stacking ensemble model for TFT-LCD panel'. Together they form a unique fingerprint.

Engineering & Materials Science