Effective puncturing schemes for block-type low-density parity-check codes

Sunghoon Choi, Youchul Shin, Jun Heo, Kihyoung Cho, Minseok Oh

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

In this paper, a puncturing method for block-type rate-compatible Low-Density Parity-Check (LDPC) codes with 'good' performance is proposed. Puncturing is a scheme to obtain a series of higher rate codes from a low rate mother code. It is widely used in channel coding but it causes performance loss compared with non-punctured error correcting codes at the same rate. There have been many researches about puncturing to reduce the performance loss. However, these researches are not optimized for specific types such as block-type LDPC (B-LDPC) codes adopted in IEEE 802.16e standards. B-LDPC codes are constructed as irregular quasi-cyclic LDPC (QC-LDPC) codes for reduced required memory size and efficient encoding. In this paper, we suggest a modified puncturing scheme which is optimized for B-LDPC codes and compare the performance with previous scheme.

Original languageEnglish
Title of host publicationIEEE Vehicular Technology Conference
Pages1841-1845
Number of pages5
DOIs
Publication statusPublished - 2007 Aug 2
Externally publishedYes
Event2007 IEEE 65th Vehicular Technology Conference - VTC2007-Spring - Dublin, Ireland
Duration: 2007 Apr 222007 Apr 25

Other

Other2007 IEEE 65th Vehicular Technology Conference - VTC2007-Spring
CountryIreland
CityDublin
Period07/4/2207/4/25

Fingerprint

Piercing
Channel coding
Data storage equipment

Keywords

  • B-grouping/sorting
  • Grouping
  • Low-density parity-check (LDPC) codes
  • Puncturing
  • Rate-compatible
  • Sorting

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Choi, S., Shin, Y., Heo, J., Cho, K., & Oh, M. (2007). Effective puncturing schemes for block-type low-density parity-check codes. In IEEE Vehicular Technology Conference (pp. 1841-1845). [4212810] https://doi.org/10.1109/VETECS.2007.382

Effective puncturing schemes for block-type low-density parity-check codes. / Choi, Sunghoon; Shin, Youchul; Heo, Jun; Cho, Kihyoung; Oh, Minseok.

IEEE Vehicular Technology Conference. 2007. p. 1841-1845 4212810.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Choi, S, Shin, Y, Heo, J, Cho, K & Oh, M 2007, Effective puncturing schemes for block-type low-density parity-check codes. in IEEE Vehicular Technology Conference., 4212810, pp. 1841-1845, 2007 IEEE 65th Vehicular Technology Conference - VTC2007-Spring, Dublin, Ireland, 07/4/22. https://doi.org/10.1109/VETECS.2007.382
Choi S, Shin Y, Heo J, Cho K, Oh M. Effective puncturing schemes for block-type low-density parity-check codes. In IEEE Vehicular Technology Conference. 2007. p. 1841-1845. 4212810 https://doi.org/10.1109/VETECS.2007.382
Choi, Sunghoon ; Shin, Youchul ; Heo, Jun ; Cho, Kihyoung ; Oh, Minseok. / Effective puncturing schemes for block-type low-density parity-check codes. IEEE Vehicular Technology Conference. 2007. pp. 1841-1845
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