The imperfect quality of CdZnTe (CZT) crystals for radiation detectors seriously diminishes their suitability for different applications. Dislocations and other dislocation-related defects, such as sub-grain boundaries and dislocation fields around Te inclusions, engender significant charge losses and, consequently, cause fluctuations in the detector's output signals, thereby hindering their spectroscopic responses. In this paper, we discuss our results from characterizing CZT material by using a high-spatial-resolution X-ray response mapping system at BNL's National Synchrotron Light Source. In this paper, we emphasize the roles of these dislocation-related defects and their contributions in degrading the detector's performance. Specifically, we compare the effects of the sub-grain- and coherent twin-boundaries on the X-ray response maps.