Effects of ionic impurities on dielectric breakdown of XLPE

Jong Bok Yoon, Kwang Suck Suh, Jae Dong Byun, Jae Hong Han, Sang Joon Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Effects of ionic impurities on the dielectric breakdown of the crosslinked polyethylene (XLPE) were studied using aqueous electrolytes. It was found that the AC breakdown strength of XLPE decreases considerably when the ions are present in the electrodes composed of aqueous electrolyte. Details of results were described.

Original languageEnglish
Title of host publicationProceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials
Editors Anon
Place of PublicationPiscataway, NJ, United States
PublisherIEEE
Pages190-193
Number of pages4
Volume1
Publication statusPublished - 1997 Jan 1
EventProceedings of the 1997 5th IEEE International Conference on Properties and Applications of Dielectric Materials. Part 1 (of 2) - Seoul, Korea
Duration: 1997 May 251997 May 30

Other

OtherProceedings of the 1997 5th IEEE International Conference on Properties and Applications of Dielectric Materials. Part 1 (of 2)
CitySeoul, Korea
Period97/5/2597/5/30

Fingerprint

Electric breakdown
Electrolytes
Impurities
Polyethylene
Polyethylenes
Ions
Electrodes

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Yoon, J. B., Suh, K. S., Byun, J. D., Han, J. H., & Kim, S. J. (1997). Effects of ionic impurities on dielectric breakdown of XLPE. In Anon (Ed.), Proceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials (Vol. 1, pp. 190-193). Piscataway, NJ, United States: IEEE.

Effects of ionic impurities on dielectric breakdown of XLPE. / Yoon, Jong Bok; Suh, Kwang Suck; Byun, Jae Dong; Han, Jae Hong; Kim, Sang Joon.

Proceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials. ed. / Anon. Vol. 1 Piscataway, NJ, United States : IEEE, 1997. p. 190-193.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Yoon, JB, Suh, KS, Byun, JD, Han, JH & Kim, SJ 1997, Effects of ionic impurities on dielectric breakdown of XLPE. in Anon (ed.), Proceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials. vol. 1, IEEE, Piscataway, NJ, United States, pp. 190-193, Proceedings of the 1997 5th IEEE International Conference on Properties and Applications of Dielectric Materials. Part 1 (of 2), Seoul, Korea, 97/5/25.
Yoon JB, Suh KS, Byun JD, Han JH, Kim SJ. Effects of ionic impurities on dielectric breakdown of XLPE. In Anon, editor, Proceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials. Vol. 1. Piscataway, NJ, United States: IEEE. 1997. p. 190-193
Yoon, Jong Bok ; Suh, Kwang Suck ; Byun, Jae Dong ; Han, Jae Hong ; Kim, Sang Joon. / Effects of ionic impurities on dielectric breakdown of XLPE. Proceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials. editor / Anon. Vol. 1 Piscataway, NJ, United States : IEEE, 1997. pp. 190-193
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