Effects of low-temperature (120 °c) annealing on the carrier concentration and trap density in amorphous indium gallium zinc oxide thin film transistors

Jae Sung Kim, Byung Su Oh, Mingxing Piao, Min Kyu Joo, Ho Kyun Jang, Seung Eon Ahn, Gyu-Tae Kim

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)

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Physics & Astronomy