Effects of proton irradiation energies on degradation of AlGaN/GaN high electron mobility transistors

Hong Yeol Kim, Ji Hyun Kim, Lu Liu, Chien Fong Lo, Fan Ren, Stephen J. Pearton

Research output: Contribution to journalArticle

27 Citations (Scopus)

Abstract

The authors report the proton energy dependence of the degradation of AlGaN/GaN high electron mobility transistors (HEMTs) with GaN cap layers from 5 to 15 MeV at a fixed dose of 5×10 15 cm -2. All the samples degraded after proton irradiation. However, higher damage in dc electrical properties was observed at lower proton energies. Saturation currents at V DS 6 V and V GS 0 V reduced by 47 after proton irradiation at 5 MeV energy, but the reduction was less by 25 and 9 at 10 and 15 MeV, respectively. Similar trends were observed in other electrical properties [transconductance (g m) and gate leakage currents]. This energy dependence from 5 to 15 MeV can be explained by the energy-dependent penetration depth of the proton. Protons with higher kinetic energy can penetrate deeper while creating less numbers of defects at shallow depths where the active layers of the HEMTs are located. These results are in good agreement with stopping and range of ions in matter results. The optimization of the AlGaN/GaN HEMT structure will be critical for space-borne applications where high fluxes of protons are encountered.

Original languageEnglish
Article number012202
JournalJournal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Volume30
Issue number1
DOIs
Publication statusPublished - 2012 Jan 1

Fingerprint

Proton irradiation
proton irradiation
High electron mobility transistors
high electron mobility transistors
Protons
degradation
proton energy
Degradation
protons
electrical properties
transconductance
stopping
Electric properties
caps
energy
leakage
penetration
kinetic energy
damage
saturation

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

Effects of proton irradiation energies on degradation of AlGaN/GaN high electron mobility transistors. / Kim, Hong Yeol; Kim, Ji Hyun; Liu, Lu; Lo, Chien Fong; Ren, Fan; Pearton, Stephen J.

In: Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, Vol. 30, No. 1, 012202, 01.01.2012.

Research output: Contribution to journalArticle

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AU - Pearton, Stephen J.

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