Effects of Pt junction on electrical transport of individual Zno nanorod device fabricated by focused ion beam

Sang Won Yoon; Jong Hyun Seo; Tae Yeon Seong; Hoon Kwon; Kon Bae Lee; Jae Pyoung Ahn

doi:10.1166/jnn.2012.4696

Effects of Pt junction on electrical transport of individual Zno nanorod device fabricated by focused ion beam

Sang Won Yoon, Jong Hyun Seo, Tae Yeon Seong, Hoon Kwon, Kon Bae Lee, Jae Pyoung Ahn

Department of Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

The electrical transport of individual ZnO nanorod devices manufactured by focused ion beam (FIB) was investigated by the direct measurement of electrical resistance at electrode junctions of crosssectioned devices using two nanoprobes. The cathodoluminescence (CL) measurements were also performed to evaluate the crystallinity at the center and edge of the cross-sectioned ZnO nanorods. The electrical transport of the individual ZnO nanorod device depends strongly on the crystallinity of the ZnO nanorod itself and the carbon contents at Pt junctions. The ZnO-Au junction of the device acted as the fastest path for electrical transport.

Original language	English
Pages (from-to)	1466-1470
Number of pages	5
Journal	Journal of Nanoscience and Nanotechnology
Volume	12
Issue number	2
DOIs	https://doi.org/10.1166/jnn.2012.4696
Publication status	Published - 2012

Keywords

Electrical Transport
FIB
Nanorod
ZnO

ASJC Scopus subject areas

Bioengineering
Chemistry(all)
Biomedical Engineering
Materials Science(all)
Condensed Matter Physics

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title = "Effects of Pt junction on electrical transport of individual Zno nanorod device fabricated by focused ion beam",

abstract = "The electrical transport of individual ZnO nanorod devices manufactured by focused ion beam (FIB) was investigated by the direct measurement of electrical resistance at electrode junctions of crosssectioned devices using two nanoprobes. The cathodoluminescence (CL) measurements were also performed to evaluate the crystallinity at the center and edge of the cross-sectioned ZnO nanorods. The electrical transport of the individual ZnO nanorod device depends strongly on the crystallinity of the ZnO nanorod itself and the carbon contents at Pt junctions. The ZnO-Au junction of the device acted as the fastest path for electrical transport.",

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AU - Yoon, Sang Won

AU - Seo, Jong Hyun

AU - Seong, Tae Yeon

AU - Kwon, Hoon

AU - Lee, Kon Bae

AU - Ahn, Jae Pyoung

PY - 2012

Y1 - 2012

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AB - The electrical transport of individual ZnO nanorod devices manufactured by focused ion beam (FIB) was investigated by the direct measurement of electrical resistance at electrode junctions of crosssectioned devices using two nanoprobes. The cathodoluminescence (CL) measurements were also performed to evaluate the crystallinity at the center and edge of the cross-sectioned ZnO nanorods. The electrical transport of the individual ZnO nanorod device depends strongly on the crystallinity of the ZnO nanorod itself and the carbon contents at Pt junctions. The ZnO-Au junction of the device acted as the fastest path for electrical transport.

KW - Electrical Transport

KW - FIB

KW - Nanorod

KW - ZnO

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