Effects of Pt junction on electrical transport of individual Zno nanorod device fabricated by focused ion beam

Sang Won Yoon, Jong Hyun Seo, Tae Yeon Seong, Hoon Kwon, Kon Bae Lee, Jae Pyoung Ahn

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

The electrical transport of individual ZnO nanorod devices manufactured by focused ion beam (FIB) was investigated by the direct measurement of electrical resistance at electrode junctions of crosssectioned devices using two nanoprobes. The cathodoluminescence (CL) measurements were also performed to evaluate the crystallinity at the center and edge of the cross-sectioned ZnO nanorods. The electrical transport of the individual ZnO nanorod device depends strongly on the crystallinity of the ZnO nanorod itself and the carbon contents at Pt junctions. The ZnO-Au junction of the device acted as the fastest path for electrical transport.

Original languageEnglish
Pages (from-to)1466-1470
Number of pages5
JournalJournal of Nanoscience and Nanotechnology
Volume12
Issue number2
DOIs
Publication statusPublished - 2012 Jun 5

Keywords

  • Electrical Transport
  • FIB
  • Nanorod
  • ZnO

ASJC Scopus subject areas

  • Bioengineering
  • Chemistry(all)
  • Biomedical Engineering
  • Materials Science(all)
  • Condensed Matter Physics

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