Effects of Pt junction on electrical transport of individual Zno nanorod device fabricated by focused ion beam

Sang Won Yoon; Jong Hyun Seo; Tae Yeon Seong; Hoon Kwon; Kon Bae Lee; Jae Pyoung Ahn

doi:10.1166/jnn.2012.4696

Effects of Pt junction on electrical transport of individual Zno nanorod device fabricated by focused ion beam

Sang Won Yoon, Jong Hyun Seo, Tae Yeon Seong, Hoon Kwon, Kon Bae Lee, Jae Pyoung Ahn

Department of Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

The electrical transport of individual ZnO nanorod devices manufactured by focused ion beam (FIB) was investigated by the direct measurement of electrical resistance at electrode junctions of crosssectioned devices using two nanoprobes. The cathodoluminescence (CL) measurements were also performed to evaluate the crystallinity at the center and edge of the cross-sectioned ZnO nanorods. The electrical transport of the individual ZnO nanorod device depends strongly on the crystallinity of the ZnO nanorod itself and the carbon contents at Pt junctions. The ZnO-Au junction of the device acted as the fastest path for electrical transport.

Original language	English
Pages (from-to)	1466-1470
Number of pages	5
Journal	Journal of Nanoscience and Nanotechnology
Volume	12
Issue number	2
DOIs	https://doi.org/10.1166/jnn.2012.4696
Publication status	Published - 2012

Keywords

Electrical Transport
FIB
Nanorod
ZnO

ASJC Scopus subject areas

Bioengineering
Chemistry(all)
Biomedical Engineering
Materials Science(all)
Condensed Matter Physics

Access to Document

10.1166/jnn.2012.4696

Fingerprint Dive into the research topics of 'Effects of Pt junction on electrical transport of individual Zno nanorod device fabricated by focused ion beam'. Together they form a unique fingerprint.

Cite this

@article{45ce316d7f8044a4a52c58b30a1bd77a,

title = "Effects of Pt junction on electrical transport of individual Zno nanorod device fabricated by focused ion beam",

abstract = "The electrical transport of individual ZnO nanorod devices manufactured by focused ion beam (FIB) was investigated by the direct measurement of electrical resistance at electrode junctions of crosssectioned devices using two nanoprobes. The cathodoluminescence (CL) measurements were also performed to evaluate the crystallinity at the center and edge of the cross-sectioned ZnO nanorods. The electrical transport of the individual ZnO nanorod device depends strongly on the crystallinity of the ZnO nanorod itself and the carbon contents at Pt junctions. The ZnO-Au junction of the device acted as the fastest path for electrical transport.",

keywords = "Electrical Transport, FIB, Nanorod, ZnO",

author = "Yoon, {Sang Won} and Seo, {Jong Hyun} and Seong, {Tae Yeon} and Hoon Kwon and Lee, {Kon Bae} and Ahn, {Jae Pyoung}",

year = "2012",

doi = "10.1166/jnn.2012.4696",

language = "English",

volume = "12",

pages = "1466--1470",

journal = "Journal of Nanoscience and Nanotechnology",

issn = "1533-4880",

publisher = "American Scientific Publishers",

number = "2",

}

TY - JOUR

T1 - Effects of Pt junction on electrical transport of individual Zno nanorod device fabricated by focused ion beam

AU - Yoon, Sang Won

AU - Seo, Jong Hyun

AU - Seong, Tae Yeon

AU - Kwon, Hoon

AU - Lee, Kon Bae

AU - Ahn, Jae Pyoung

PY - 2012

Y1 - 2012

N2 - The electrical transport of individual ZnO nanorod devices manufactured by focused ion beam (FIB) was investigated by the direct measurement of electrical resistance at electrode junctions of crosssectioned devices using two nanoprobes. The cathodoluminescence (CL) measurements were also performed to evaluate the crystallinity at the center and edge of the cross-sectioned ZnO nanorods. The electrical transport of the individual ZnO nanorod device depends strongly on the crystallinity of the ZnO nanorod itself and the carbon contents at Pt junctions. The ZnO-Au junction of the device acted as the fastest path for electrical transport.

AB - The electrical transport of individual ZnO nanorod devices manufactured by focused ion beam (FIB) was investigated by the direct measurement of electrical resistance at electrode junctions of crosssectioned devices using two nanoprobes. The cathodoluminescence (CL) measurements were also performed to evaluate the crystallinity at the center and edge of the cross-sectioned ZnO nanorods. The electrical transport of the individual ZnO nanorod device depends strongly on the crystallinity of the ZnO nanorod itself and the carbon contents at Pt junctions. The ZnO-Au junction of the device acted as the fastest path for electrical transport.

KW - Electrical Transport

KW - FIB

KW - Nanorod

KW - ZnO

UR - http://www.scopus.com/inward/record.url?scp=84861674693&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84861674693&partnerID=8YFLogxK

U2 - 10.1166/jnn.2012.4696

DO - 10.1166/jnn.2012.4696

M3 - Article

C2 - 22629980

AN - SCOPUS:84861674693

VL - 12

SP - 1466

EP - 1470

JO - Journal of Nanoscience and Nanotechnology

JF - Journal of Nanoscience and Nanotechnology

SN - 1533-4880

IS - 2

ER -

Effects of Pt junction on electrical transport of individual Zno nanorod device fabricated by focused ion beam

Abstract

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Cite this