Effects of the networks of subgrain boundaries on spectral responses of thick CdZnTe detectors

A. E. Bolotnikov, J. Butcher, G. S. Camarda, Y. Cui, S. U. Egarievwe, P. Fochuk, R. Gul, M. Hamade, A. Hossain, Kihyun Kim, O. V. Kopach, M. Petryk, B. Raghothamachar, G. Yang, R. B. James

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

CdZnTe (CZT) crystals used for nuclear-radiation detectors often contain high concentrations of subgrain boundaries and networks of poligonized dislocations that can significantly degrade the performance of semiconductor devices. These defects exist in all commercial CZT materials, regardless of their growth techniques and their vendor. We describe our new results from examining such detectors using IR transmission microscopy and white X-ray beam diffraction topography. We emphasize the roles on the devices' performances of networks of subgrain boundaries with low dislocation densities, such as poligonized dislocations and mosaic structures. Specifically, we evaluated their effects on the gamma-ray responses of thick, >10 mm, CZT detectors. Our findings set the lower limit on the energy resolution of CZT detectors containing dense networks of subgrain boundaries and walls of dislocations.

Original languageEnglish
Title of host publicationHard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII
DOIs
Publication statusPublished - 2011 Nov 2
Externally publishedYes
EventHard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII - San Diego, CA, United States
Duration: 2011 Aug 222011 Aug 24

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8142
ISSN (Print)0277-786X

Conference

ConferenceHard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII
CountryUnited States
CitySan Diego, CA
Period11/8/2211/8/24

Fingerprint

CdZnTe
Spectral Response
Dislocation
spectral sensitivity
Detector
Detectors
detectors
Infrared transmission
Radiation detectors
Semiconductor devices
Radiation Detectors
nuclear radiation
Gamma rays
Topography
Semiconductor Devices
radiation detectors
Microscopic examination
Gamma Rays
Diffraction
semiconductor devices

Keywords

  • CdZnTe detectors
  • crystal defects
  • virtual Frisch-grid detectors

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Bolotnikov, A. E., Butcher, J., Camarda, G. S., Cui, Y., Egarievwe, S. U., Fochuk, P., ... James, R. B. (2011). Effects of the networks of subgrain boundaries on spectral responses of thick CdZnTe detectors. In Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII [814206] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8142). https://doi.org/10.1117/12.896223

Effects of the networks of subgrain boundaries on spectral responses of thick CdZnTe detectors. / Bolotnikov, A. E.; Butcher, J.; Camarda, G. S.; Cui, Y.; Egarievwe, S. U.; Fochuk, P.; Gul, R.; Hamade, M.; Hossain, A.; Kim, Kihyun; Kopach, O. V.; Petryk, M.; Raghothamachar, B.; Yang, G.; James, R. B.

Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII. 2011. 814206 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8142).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Bolotnikov, AE, Butcher, J, Camarda, GS, Cui, Y, Egarievwe, SU, Fochuk, P, Gul, R, Hamade, M, Hossain, A, Kim, K, Kopach, OV, Petryk, M, Raghothamachar, B, Yang, G & James, RB 2011, Effects of the networks of subgrain boundaries on spectral responses of thick CdZnTe detectors. in Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII., 814206, Proceedings of SPIE - The International Society for Optical Engineering, vol. 8142, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII, San Diego, CA, United States, 11/8/22. https://doi.org/10.1117/12.896223
Bolotnikov AE, Butcher J, Camarda GS, Cui Y, Egarievwe SU, Fochuk P et al. Effects of the networks of subgrain boundaries on spectral responses of thick CdZnTe detectors. In Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII. 2011. 814206. (Proceedings of SPIE - The International Society for Optical Engineering). https://doi.org/10.1117/12.896223
Bolotnikov, A. E. ; Butcher, J. ; Camarda, G. S. ; Cui, Y. ; Egarievwe, S. U. ; Fochuk, P. ; Gul, R. ; Hamade, M. ; Hossain, A. ; Kim, Kihyun ; Kopach, O. V. ; Petryk, M. ; Raghothamachar, B. ; Yang, G. ; James, R. B. / Effects of the networks of subgrain boundaries on spectral responses of thick CdZnTe detectors. Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII. 2011. (Proceedings of SPIE - The International Society for Optical Engineering).
@inproceedings{12e3e65f804943b3b0733951375c276e,
title = "Effects of the networks of subgrain boundaries on spectral responses of thick CdZnTe detectors",
abstract = "CdZnTe (CZT) crystals used for nuclear-radiation detectors often contain high concentrations of subgrain boundaries and networks of poligonized dislocations that can significantly degrade the performance of semiconductor devices. These defects exist in all commercial CZT materials, regardless of their growth techniques and their vendor. We describe our new results from examining such detectors using IR transmission microscopy and white X-ray beam diffraction topography. We emphasize the roles on the devices' performances of networks of subgrain boundaries with low dislocation densities, such as poligonized dislocations and mosaic structures. Specifically, we evaluated their effects on the gamma-ray responses of thick, >10 mm, CZT detectors. Our findings set the lower limit on the energy resolution of CZT detectors containing dense networks of subgrain boundaries and walls of dislocations.",
keywords = "CdZnTe detectors, crystal defects, virtual Frisch-grid detectors",
author = "Bolotnikov, {A. E.} and J. Butcher and Camarda, {G. S.} and Y. Cui and Egarievwe, {S. U.} and P. Fochuk and R. Gul and M. Hamade and A. Hossain and Kihyun Kim and Kopach, {O. V.} and M. Petryk and B. Raghothamachar and G. Yang and James, {R. B.}",
year = "2011",
month = "11",
day = "2",
doi = "10.1117/12.896223",
language = "English",
isbn = "9780819487520",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
booktitle = "Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII",

}

TY - GEN

T1 - Effects of the networks of subgrain boundaries on spectral responses of thick CdZnTe detectors

AU - Bolotnikov, A. E.

AU - Butcher, J.

AU - Camarda, G. S.

AU - Cui, Y.

AU - Egarievwe, S. U.

AU - Fochuk, P.

AU - Gul, R.

AU - Hamade, M.

AU - Hossain, A.

AU - Kim, Kihyun

AU - Kopach, O. V.

AU - Petryk, M.

AU - Raghothamachar, B.

AU - Yang, G.

AU - James, R. B.

PY - 2011/11/2

Y1 - 2011/11/2

N2 - CdZnTe (CZT) crystals used for nuclear-radiation detectors often contain high concentrations of subgrain boundaries and networks of poligonized dislocations that can significantly degrade the performance of semiconductor devices. These defects exist in all commercial CZT materials, regardless of their growth techniques and their vendor. We describe our new results from examining such detectors using IR transmission microscopy and white X-ray beam diffraction topography. We emphasize the roles on the devices' performances of networks of subgrain boundaries with low dislocation densities, such as poligonized dislocations and mosaic structures. Specifically, we evaluated their effects on the gamma-ray responses of thick, >10 mm, CZT detectors. Our findings set the lower limit on the energy resolution of CZT detectors containing dense networks of subgrain boundaries and walls of dislocations.

AB - CdZnTe (CZT) crystals used for nuclear-radiation detectors often contain high concentrations of subgrain boundaries and networks of poligonized dislocations that can significantly degrade the performance of semiconductor devices. These defects exist in all commercial CZT materials, regardless of their growth techniques and their vendor. We describe our new results from examining such detectors using IR transmission microscopy and white X-ray beam diffraction topography. We emphasize the roles on the devices' performances of networks of subgrain boundaries with low dislocation densities, such as poligonized dislocations and mosaic structures. Specifically, we evaluated their effects on the gamma-ray responses of thick, >10 mm, CZT detectors. Our findings set the lower limit on the energy resolution of CZT detectors containing dense networks of subgrain boundaries and walls of dislocations.

KW - CdZnTe detectors

KW - crystal defects

KW - virtual Frisch-grid detectors

UR - http://www.scopus.com/inward/record.url?scp=80055038963&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=80055038963&partnerID=8YFLogxK

U2 - 10.1117/12.896223

DO - 10.1117/12.896223

M3 - Conference contribution

AN - SCOPUS:80055038963

SN - 9780819487520

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII

ER -