CdZnTe (CZT) crystals used for nuclear-radiation detectors often contain high concentrations of subgrain boundaries and networks of poligonized dislocations that can significantly degrade the performance of semiconductor devices. These defects exist in all commercial CZT materials, regardless of their growth techniques and their vendor. We describe our new results from examining such detectors using IR transmission microscopy and white X-ray beam diffraction topography. We emphasize the roles on the devices' performances of networks of subgrain boundaries with low dislocation densities, such as poligonized dislocations and mosaic structures. Specifically, we evaluated their effects on the gamma-ray responses of thick, >10 mm, CZT detectors. Our findings set the lower limit on the energy resolution of CZT detectors containing dense networks of subgrain boundaries and walls of dislocations.