Effects of thermal annealing on the structural properties of CdZnTe crystals

G. Yang, A. E. Bolotnikov, P. M. Fochuk, Y. Cui, G. S. Camarda, A. Hossain, K. H. Kim, J. Horace, B. McCall, R. Gul, O. V. Kopach, S. U. Egarievwe, R. B. James

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Although cadmium zinc telluride (CZT) is one of leading materials for fabricating room-temperature nuclear-radiation- detectors, different defects in the crystals can degrade the performance of CZT detectors. Post-growth thermal annealing potentially offers a satisfactory way to eliminate the deleterious influence of these defects. Here, we report that the annealing of CZT in Cd vapor effectively lowers the density of Te inclusions. It takes a much longer annealing time to eliminate separate large Te inclusions than small ones; however, the annealing time is greatly reduced when the large Te inclusions are distributed along grain boundaries. We found that sub-grain boundaries still exist after the annealing at 500°C, indicating that a higher annealing temperature might be needed.

Original languageEnglish
Title of host publicationHard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII
DOIs
Publication statusPublished - 2011
EventHard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII - San Diego, CA, United States
Duration: 2011 Aug 222011 Aug 24

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8142
ISSN (Print)0277-786X

Conference

ConferenceHard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII
CountryUnited States
CitySan Diego, CA
Period11/8/2211/8/24

Keywords

  • CZT
  • Te inclusions
  • annealing
  • radiation detection
  • sub-grain boundaries

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Yang, G., Bolotnikov, A. E., Fochuk, P. M., Cui, Y., Camarda, G. S., Hossain, A., Kim, K. H., Horace, J., McCall, B., Gul, R., Kopach, O. V., Egarievwe, S. U., & James, R. B. (2011). Effects of thermal annealing on the structural properties of CdZnTe crystals. In Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII [814217] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8142). https://doi.org/10.1117/12.894961