Electric field distribution of cadmium zinc telluride (CZT) detectors

G. Yang, A. E. Bolotnikov, G. S. Camarda, Y. Cui, A. Hossain, Kihyun Kim, R. B. James

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Cadmium Zinc Telluride (CZT) is attracting increasing interest with its promise as a room-temperature nuclear-radiationdetector material. The distribution of the electric field in CZT detectors substantially affects their detection performance. At Brookhaven National Laboratory (BNL), we employed a synchrotron X-Ray mapping technique and a Pockels-effect measurement system to investigate this distribution in different detectors. Here, we report our latest experimental results with three detectors of different width/height ratios. A decrease in this ratio aggravates the non-uniform distribution of electric field, and focuses it on the central volume. Raising the bias voltage effectively can minimize such nonuniformity of the electric field distribution. The position of the maximum electric field is independent of the bias voltage; the difference between its maximum- and minimum-intensity of electric field increases with the applied bias voltage.

Original languageEnglish
Title of host publicationHard X-Ray, Gamma-Ray, and Neutron Detector Physics XI
DOIs
Publication statusPublished - 2009 Dec 11
Externally publishedYes
EventHard X-Ray, Gamma-Ray, and Neutron Detector Physics XI - San Diego, CA, United States
Duration: 2009 Aug 32009 Aug 6

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7449
ISSN (Print)0277-786X

Conference

ConferenceHard X-Ray, Gamma-Ray, and Neutron Detector Physics XI
CountryUnited States
CitySan Diego, CA
Period09/8/309/8/6

Fingerprint

zinc tellurides
cadmium tellurides
Zinc
Cadmium
Electric Field
Electric fields
Detector
Detectors
Bias voltage
electric fields
detectors
Voltage
electric potential
Non-uniformity
Measurement System
Synchrotrons
nonuniformity
birefringence
synchrotrons
CdZnTe

Keywords

  • CdZnTe
  • Electric field
  • Pockels effect
  • Radiation detection
  • X-ray mapping

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Yang, G., Bolotnikov, A. E., Camarda, G. S., Cui, Y., Hossain, A., Kim, K., & James, R. B. (2009). Electric field distribution of cadmium zinc telluride (CZT) detectors. In Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI [74490C] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7449). https://doi.org/10.1117/12.826909

Electric field distribution of cadmium zinc telluride (CZT) detectors. / Yang, G.; Bolotnikov, A. E.; Camarda, G. S.; Cui, Y.; Hossain, A.; Kim, Kihyun; James, R. B.

Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI. 2009. 74490C (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7449).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Yang, G, Bolotnikov, AE, Camarda, GS, Cui, Y, Hossain, A, Kim, K & James, RB 2009, Electric field distribution of cadmium zinc telluride (CZT) detectors. in Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI., 74490C, Proceedings of SPIE - The International Society for Optical Engineering, vol. 7449, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI, San Diego, CA, United States, 09/8/3. https://doi.org/10.1117/12.826909
Yang G, Bolotnikov AE, Camarda GS, Cui Y, Hossain A, Kim K et al. Electric field distribution of cadmium zinc telluride (CZT) detectors. In Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI. 2009. 74490C. (Proceedings of SPIE - The International Society for Optical Engineering). https://doi.org/10.1117/12.826909
Yang, G. ; Bolotnikov, A. E. ; Camarda, G. S. ; Cui, Y. ; Hossain, A. ; Kim, Kihyun ; James, R. B. / Electric field distribution of cadmium zinc telluride (CZT) detectors. Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI. 2009. (Proceedings of SPIE - The International Society for Optical Engineering).
@inproceedings{ae6aad5915cf4e9aabc65559dc2c17d5,
title = "Electric field distribution of cadmium zinc telluride (CZT) detectors",
abstract = "Cadmium Zinc Telluride (CZT) is attracting increasing interest with its promise as a room-temperature nuclear-radiationdetector material. The distribution of the electric field in CZT detectors substantially affects their detection performance. At Brookhaven National Laboratory (BNL), we employed a synchrotron X-Ray mapping technique and a Pockels-effect measurement system to investigate this distribution in different detectors. Here, we report our latest experimental results with three detectors of different width/height ratios. A decrease in this ratio aggravates the non-uniform distribution of electric field, and focuses it on the central volume. Raising the bias voltage effectively can minimize such nonuniformity of the electric field distribution. The position of the maximum electric field is independent of the bias voltage; the difference between its maximum- and minimum-intensity of electric field increases with the applied bias voltage.",
keywords = "CdZnTe, Electric field, Pockels effect, Radiation detection, X-ray mapping",
author = "G. Yang and Bolotnikov, {A. E.} and Camarda, {G. S.} and Y. Cui and A. Hossain and Kihyun Kim and James, {R. B.}",
year = "2009",
month = "12",
day = "11",
doi = "10.1117/12.826909",
language = "English",
isbn = "9780819477392",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
booktitle = "Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI",

}

TY - GEN

T1 - Electric field distribution of cadmium zinc telluride (CZT) detectors

AU - Yang, G.

AU - Bolotnikov, A. E.

AU - Camarda, G. S.

AU - Cui, Y.

AU - Hossain, A.

AU - Kim, Kihyun

AU - James, R. B.

PY - 2009/12/11

Y1 - 2009/12/11

N2 - Cadmium Zinc Telluride (CZT) is attracting increasing interest with its promise as a room-temperature nuclear-radiationdetector material. The distribution of the electric field in CZT detectors substantially affects their detection performance. At Brookhaven National Laboratory (BNL), we employed a synchrotron X-Ray mapping technique and a Pockels-effect measurement system to investigate this distribution in different detectors. Here, we report our latest experimental results with three detectors of different width/height ratios. A decrease in this ratio aggravates the non-uniform distribution of electric field, and focuses it on the central volume. Raising the bias voltage effectively can minimize such nonuniformity of the electric field distribution. The position of the maximum electric field is independent of the bias voltage; the difference between its maximum- and minimum-intensity of electric field increases with the applied bias voltage.

AB - Cadmium Zinc Telluride (CZT) is attracting increasing interest with its promise as a room-temperature nuclear-radiationdetector material. The distribution of the electric field in CZT detectors substantially affects their detection performance. At Brookhaven National Laboratory (BNL), we employed a synchrotron X-Ray mapping technique and a Pockels-effect measurement system to investigate this distribution in different detectors. Here, we report our latest experimental results with three detectors of different width/height ratios. A decrease in this ratio aggravates the non-uniform distribution of electric field, and focuses it on the central volume. Raising the bias voltage effectively can minimize such nonuniformity of the electric field distribution. The position of the maximum electric field is independent of the bias voltage; the difference between its maximum- and minimum-intensity of electric field increases with the applied bias voltage.

KW - CdZnTe

KW - Electric field

KW - Pockels effect

KW - Radiation detection

KW - X-ray mapping

UR - http://www.scopus.com/inward/record.url?scp=71449120461&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=71449120461&partnerID=8YFLogxK

U2 - 10.1117/12.826909

DO - 10.1117/12.826909

M3 - Conference contribution

SN - 9780819477392

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI

ER -