Electric property evolution of structurally defected multilayer grapheme

Kim Kanghyun, Ju Park Hyung, Byung Chill Woo, Jin Kim Kook, Gyu-Tae Kim, Soo Yun Wan

Research output: Contribution to journalArticle

142 Citations (Scopus)

Abstract

We report on the influence of structural disorder on the electrical properties of multilayer graphene (MLG). Exponential decreases in the conductance and transconductance with increase of defects in the MLG were observed, which could be explained by the percolation and the variable range hopping conduction. An enhancement of p-type nature with increasing disorders was considered to be the result of oxygen doping in the graphene sheets introduced by oxygen plasma. The rapid increase of low-frequency noise was attributed to the formation of conductive network through the continuum percolation, as the low-frequency noise could be increased by the enhanced carrier scattering at the defect sites. We hope that our result should suggest a simple method of tuning the electrical properties of graphene.

Original languageEnglish
Pages (from-to)3092-3096
Number of pages5
JournalNano Letters
Volume8
Issue number10
DOIs
Publication statusPublished - 2008 Oct 1

Fingerprint

Graphite
Graphene
graphene
Multilayers
Electric properties
electrical properties
disorders
Oxygen
low frequencies
Defects
defects
oxygen plasma
Transconductance
transconductance
Tuning
tuning
Doping (additives)
Scattering
continuums
Plasmas

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Bioengineering
  • Chemistry(all)
  • Materials Science(all)
  • Mechanical Engineering

Cite this

Kanghyun, K., Hyung, J. P., Woo, B. C., Kook, J. K., Kim, G-T., & Wan, S. Y. (2008). Electric property evolution of structurally defected multilayer grapheme. Nano Letters, 8(10), 3092-3096. https://doi.org/10.1021/nl8010337

Electric property evolution of structurally defected multilayer grapheme. / Kanghyun, Kim; Hyung, Ju Park; Woo, Byung Chill; Kook, Jin Kim; Kim, Gyu-Tae; Wan, Soo Yun.

In: Nano Letters, Vol. 8, No. 10, 01.10.2008, p. 3092-3096.

Research output: Contribution to journalArticle

Kanghyun, K, Hyung, JP, Woo, BC, Kook, JK, Kim, G-T & Wan, SY 2008, 'Electric property evolution of structurally defected multilayer grapheme', Nano Letters, vol. 8, no. 10, pp. 3092-3096. https://doi.org/10.1021/nl8010337
Kanghyun, Kim ; Hyung, Ju Park ; Woo, Byung Chill ; Kook, Jin Kim ; Kim, Gyu-Tae ; Wan, Soo Yun. / Electric property evolution of structurally defected multilayer grapheme. In: Nano Letters. 2008 ; Vol. 8, No. 10. pp. 3092-3096.
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