Electrical characteristics of flexible amorphous indium-tin-gallium-zinc oxide thin-film transistors under repetitive mechanical stress

Hosang Lee, Kyoungah Cho, Heesung Kong, Seungjun Lee, Junhyung Lim, Sangsig Kim

Research output: Contribution to journal › Article › peer-review

Fingerprint

Dive into the research topics of 'Electrical characteristics of flexible amorphous indium-tin-gallium-zinc oxide thin-film transistors under repetitive mechanical stress'. Together they form a unique fingerprint.

Engineering & Materials Science

Physics & Astronomy