Electrical characterization of 5 MeV proton-irradiated few layer graphene

G. Ko, H. Y. Kim, F. Ren, S. J. Pearton, Ji Hyun Kim

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

Few layer graphene (FLG) samples contacted were irradiated with protons at an energy of 5 MeV and doses up to 2× 1015 /cm2. The electrical properties of ungated FLG sheets contacted by Pd/Au in a source (S)-drain (D) configuration, including VDS - IDS, VG - IDS, and the hole mobility, were compared before and after proton irradiation. After irradiation, it is observed that the ambipolar conduction of the FLG sheets was changed to a p-type conduction. The field-effect mobility of the hole carriers and the resistance in the graphene sheets greatly decreased because the proton irradiation increased the number of the surface states.

Original languageEnglish
JournalElectrochemical and Solid-State Letters
Volume13
Issue number4
DOIs
Publication statusPublished - 2010 Feb 22

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Graphene
Protons
graphene
Proton irradiation
proton irradiation
protons
conduction
Hole mobility
hole mobility
Surface states
Electric properties
electrical properties
Irradiation
dosage
irradiation
configurations
energy

ASJC Scopus subject areas

  • Electrochemistry
  • Electrical and Electronic Engineering
  • Materials Science(all)
  • Chemical Engineering(all)
  • Physical and Theoretical Chemistry

Cite this

Electrical characterization of 5 MeV proton-irradiated few layer graphene. / Ko, G.; Kim, H. Y.; Ren, F.; Pearton, S. J.; Kim, Ji Hyun.

In: Electrochemical and Solid-State Letters, Vol. 13, No. 4, 22.02.2010.

Research output: Contribution to journalArticle

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