Electro-optic measurement of Langmuir-Blodgett films layered with N-docosylquinolinium-TCNQ

Dong Myung Shin, Kang Hoon Choi, Dou Yol Kang, Tae Wan Kim, Dong Hoon Choi

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Electro-optic coefficient, refractive index and dielectric dispersion for the Langmuir-Blodgett (LB) films of N-docosylquinolinium-TCNQ were obtained. The thickness of one layer of the LB film was 38.14Å at the surface pressure of 30mN/m, and the refractive index calculated from spectroscopic ellipsometry was 1.2∼1.3. The dielectric dispersion shows the frequency dependence of the orientational polarization and the resonance frequency, fr, was about 1.5kHz in the film. The electro-optic effect for the LB film were measured from the simple reflection technique. Suprisingly large electro-optic coefficient, 98.7∼69.3pm/V, were obtained.

Original languageEnglish
Pages (from-to)2093-2094
Number of pages2
JournalSynthetic Metals
Volume71
Issue number1-3
Publication statusPublished - 1995 Apr 1
Externally publishedYes

Fingerprint

Langmuir Blodgett films
Electrooptical effects
Langmuir-Blodgett films
electro-optics
Refractive index
Permittivity
refractivity
Spectroscopic ellipsometry
coefficients
ellipsometry
Polarization
polarization
tetracyanoquinodimethane

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Metals and Alloys
  • Materials Chemistry
  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials
  • Mechanical Engineering
  • Polymers and Plastics

Cite this

Shin, D. M., Choi, K. H., Kang, D. Y., Kim, T. W., & Choi, D. H. (1995). Electro-optic measurement of Langmuir-Blodgett films layered with N-docosylquinolinium-TCNQ. Synthetic Metals, 71(1-3), 2093-2094.

Electro-optic measurement of Langmuir-Blodgett films layered with N-docosylquinolinium-TCNQ. / Shin, Dong Myung; Choi, Kang Hoon; Kang, Dou Yol; Kim, Tae Wan; Choi, Dong Hoon.

In: Synthetic Metals, Vol. 71, No. 1-3, 01.04.1995, p. 2093-2094.

Research output: Contribution to journalArticle

Shin, DM, Choi, KH, Kang, DY, Kim, TW & Choi, DH 1995, 'Electro-optic measurement of Langmuir-Blodgett films layered with N-docosylquinolinium-TCNQ', Synthetic Metals, vol. 71, no. 1-3, pp. 2093-2094.
Shin, Dong Myung ; Choi, Kang Hoon ; Kang, Dou Yol ; Kim, Tae Wan ; Choi, Dong Hoon. / Electro-optic measurement of Langmuir-Blodgett films layered with N-docosylquinolinium-TCNQ. In: Synthetic Metals. 1995 ; Vol. 71, No. 1-3. pp. 2093-2094.
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