Electrostatic discharge sensitivity of giant magnetoresistive recording heads

Albert J. Wallash, Young-geun Kim

Research output: Contribution to journalArticle

29 Citations (Scopus)

Abstract

In this article electrostatic discharge (ESD) damage to giant magnetoresistive (GMR) recording heads is studied for the first time The ESD failure threshold was measured using an extremely short duration (1 ns) metal contact ESD transient. The failure energy required to melt the GMR recording head was 2.3 nJ, about half of the 5 nJ of energy needed to melt a conventional anisotropic magnetoresistive (AMR) head design. Scanning electron microscope scans of ESD damaged AMR and GMR heads snow localized melting of the sensors. It is concluded that recording heads with GMR sensors, planned for use in the near future, will have significantly lower ESD failure thresholds than AMR recording heads in use today. Finally, scaling arguments show that an AMR bead design with the same reduced cross-sectional area of the GMR head has a comparable ESD failure threshold.

Original languageEnglish
Pages (from-to)4921-4923
Number of pages3
JournalJournal of Applied Physics
Volume81
Issue number8 PART 2B
Publication statusPublished - 1997 Apr 15
Externally publishedYes

Fingerprint

recording heads
electrostatics
sensitivity
thresholds
sensors
snow
beads
electric contacts
electron microscopes
melting
damage
scaling
scanning
energy
metals

ASJC Scopus subject areas

  • Physics and Astronomy(all)
  • Physics and Astronomy (miscellaneous)

Cite this

Electrostatic discharge sensitivity of giant magnetoresistive recording heads. / Wallash, Albert J.; Kim, Young-geun.

In: Journal of Applied Physics, Vol. 81, No. 8 PART 2B, 15.04.1997, p. 4921-4923.

Research output: Contribution to journalArticle

@article{c9e20b55eebb4ec7adcba9388850533d,
title = "Electrostatic discharge sensitivity of giant magnetoresistive recording heads",
abstract = "In this article electrostatic discharge (ESD) damage to giant magnetoresistive (GMR) recording heads is studied for the first time The ESD failure threshold was measured using an extremely short duration (1 ns) metal contact ESD transient. The failure energy required to melt the GMR recording head was 2.3 nJ, about half of the 5 nJ of energy needed to melt a conventional anisotropic magnetoresistive (AMR) head design. Scanning electron microscope scans of ESD damaged AMR and GMR heads snow localized melting of the sensors. It is concluded that recording heads with GMR sensors, planned for use in the near future, will have significantly lower ESD failure thresholds than AMR recording heads in use today. Finally, scaling arguments show that an AMR bead design with the same reduced cross-sectional area of the GMR head has a comparable ESD failure threshold.",
author = "Wallash, {Albert J.} and Young-geun Kim",
year = "1997",
month = "4",
day = "15",
language = "English",
volume = "81",
pages = "4921--4923",
journal = "Journal of Applied Physics",
issn = "0021-8979",
publisher = "American Institute of Physics Publising LLC",
number = "8 PART 2B",

}

TY - JOUR

T1 - Electrostatic discharge sensitivity of giant magnetoresistive recording heads

AU - Wallash, Albert J.

AU - Kim, Young-geun

PY - 1997/4/15

Y1 - 1997/4/15

N2 - In this article electrostatic discharge (ESD) damage to giant magnetoresistive (GMR) recording heads is studied for the first time The ESD failure threshold was measured using an extremely short duration (1 ns) metal contact ESD transient. The failure energy required to melt the GMR recording head was 2.3 nJ, about half of the 5 nJ of energy needed to melt a conventional anisotropic magnetoresistive (AMR) head design. Scanning electron microscope scans of ESD damaged AMR and GMR heads snow localized melting of the sensors. It is concluded that recording heads with GMR sensors, planned for use in the near future, will have significantly lower ESD failure thresholds than AMR recording heads in use today. Finally, scaling arguments show that an AMR bead design with the same reduced cross-sectional area of the GMR head has a comparable ESD failure threshold.

AB - In this article electrostatic discharge (ESD) damage to giant magnetoresistive (GMR) recording heads is studied for the first time The ESD failure threshold was measured using an extremely short duration (1 ns) metal contact ESD transient. The failure energy required to melt the GMR recording head was 2.3 nJ, about half of the 5 nJ of energy needed to melt a conventional anisotropic magnetoresistive (AMR) head design. Scanning electron microscope scans of ESD damaged AMR and GMR heads snow localized melting of the sensors. It is concluded that recording heads with GMR sensors, planned for use in the near future, will have significantly lower ESD failure thresholds than AMR recording heads in use today. Finally, scaling arguments show that an AMR bead design with the same reduced cross-sectional area of the GMR head has a comparable ESD failure threshold.

UR - http://www.scopus.com/inward/record.url?scp=0000484611&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0000484611&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0000484611

VL - 81

SP - 4921

EP - 4923

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 8 PART 2B

ER -