Enhancing low-resolution facial images using error back-projection for human identification at a distance

Jeong Seon Park, Seong Whan Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

This paper proposes a new method of enhancing the resolution of low-resolution facial images using an error back-projection method based on a top-down learning. A face is represented by a linear combination of prototypes of shape and texture. With the shape and texture information about the pixels in a given low-resolution facial image, we can estimate optimal coefficients for a linear combination of prototypes of shape and those of texture by solving least square minimization. Then high-resolution facial image can be obtained by using the optimal coefficients for linear combination of the high-resolution prototypes. In addition, an error back-projection procedure is applied to improve the accuracy of resolution enhancement.

Original languageEnglish
Title of host publicationProceedings of the 17th International Conference on Pattern Recognition, ICPR 2004
EditorsJ. Kittler, M. Petrou, M. Nixon
Pages346-349
Number of pages4
DOIs
Publication statusPublished - 2004
EventProceedings of the 17th International Conference on Pattern Recognition, ICPR 2004 - Cambridge, United Kingdom
Duration: 2004 Aug 232004 Aug 26

Publication series

NameProceedings - International Conference on Pattern Recognition
Volume1
ISSN (Print)1051-4651

Other

OtherProceedings of the 17th International Conference on Pattern Recognition, ICPR 2004
CountryUnited Kingdom
CityCambridge
Period04/8/2304/8/26

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition

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  • Cite this

    Park, J. S., & Lee, S. W. (2004). Enhancing low-resolution facial images using error back-projection for human identification at a distance. In J. Kittler, M. Petrou, & M. Nixon (Eds.), Proceedings of the 17th International Conference on Pattern Recognition, ICPR 2004 (pp. 346-349). (Proceedings - International Conference on Pattern Recognition; Vol. 1). https://doi.org/10.1109/ICPR.2004.1334123