Erratum: A novel statistical approach to detect card frauds using transaction patterns

Chae Chang Lee, Ji Won Yoon

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)999
Number of pages1
JournalIEICE Transactions on Information and Systems
VolumeE98D
Issue number4
Publication statusPublished - 2015 Apr 1

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Software
  • Artificial Intelligence
  • Hardware and Architecture
  • Computer Vision and Pattern Recognition

Cite this

Erratum : A novel statistical approach to detect card frauds using transaction patterns. / Lee, Chae Chang; Yoon, Ji Won.

In: IEICE Transactions on Information and Systems, Vol. E98D, No. 4, 01.04.2015, p. 999.

Research output: Contribution to journalArticle

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