Erratum: Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures(Opt. Express (2008), 16, (7407-7417)).

A. J.L. Adam; J. M. Brok; M. A. Seo; K. J. Ahn; D. S. Kim; J. H. Kang; Q. H. Park; M. Nagel; P. C.M. Planken

doi:10.1364/OE.16.008054

Erratum: Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures(Opt. Express (2008), 16, (7407-7417)).

A. J.L. Adam, J. M. Brok, M. A. Seo, K. J. Ahn, D. S. Kim, J. H. Kang, Q. H. Park, M. Nagel, P. C.M. Planken

Department of Physics

Research output: Contribution to journal › Comment/debate

2 Citations (Scopus)

Original language	English
Pages (from-to)	8054
Number of pages	1
Journal	Optics Express
Volume	16
Issue number	11
DOIs	https://doi.org/10.1364/OE.16.008054
Publication status	Published - 2008 May 26

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics

Access to Document

10.1364/OE.16.008054

Cite this

Erratum : Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures(Opt. Express (2008), 16, (7407-7417)). / Adam, A. J.L.; Brok, J. M.; Seo, M. A.; Ahn, K. J.; Kim, D. S.; Kang, J. H.; Park, Q. H.; Nagel, M.; Planken, P. C.M.

In: Optics Express, Vol. 16, No. 11, 26.05.2008, p. 8054.

Research output: Contribution to journal › Comment/debate

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