Erratum: Quantitative extraction of temperature-dependent barrier height and channel resistance of a-SIZO/OMO and a-SIZO/IZO thin-film transistors (IEEE Electron Device Letters (2013) 34: 2 (247-249) )

K. Heo, B. H. Hong, E. H. Lee, S. Y. Lee, S. Kim, S. W. Hwang

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