Erratum

Switching characterization and failure analysis of In 2Se 3 based phase change memory" (Japanese Journal of Applied Physics (2005) 44 (4759))

Heon Lee, Dae Hwan Kang

Research output: Contribution to journalArticle

Original languageEnglish
Article number089201
JournalJapanese Journal of Applied Physics
Volume51
Issue number8 PART 1
DOIs
Publication statusPublished - 2012 Aug 1

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Phase change memory
failure analysis
Failure analysis
Physics
physics

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

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