Abstract
The fabrication of Er-doped amorphous SiOx films by laser ablation of a Si:Er2O3 target in He atmosphere was discussed. A time-of-flight quadrupole mass spectroscopy was adopted to obtain kinetic energies of ionic species in a plume produced by laser ablation. It was found that the photoluminscence intensity at 1.54 μm was highly dependent on the oxygen content in the film.
Original language | English |
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Pages (from-to) | 3436-3438 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 82 |
Issue number | 20 |
DOIs | |
Publication status | Published - 2003 May 19 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)