Estimation of the electrical properties of random nanotube networks by SPICE simulation

Pil Soo Kang, Gyu-Tae Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The electrical properties of the percolating networks of carbon nanotubes were simulated by using the circuit simulator. Near the percolation threshold, the whole electrical characteristics of networks are strongly affected by contacts among nanotubes. The electrical contacts on the representative network of nanotube, carbon nanotube network, were modeled by suitable diode models. The non-linear voltage-current (V-I) characteristics at the lower density of the percolated random network can be well explained.

Original languageEnglish
Title of host publicationAIP Conference Proceedings
Pages787-788
Number of pages2
Volume1399
DOIs
Publication statusPublished - 2011 Dec 1
Event30th International Conference on the Physics of Semiconductors, ICPS-30 - Seoul, Korea, Republic of
Duration: 2010 Jul 252010 Jul 30

Other

Other30th International Conference on the Physics of Semiconductors, ICPS-30
CountryKorea, Republic of
CitySeoul
Period10/7/2510/7/30

Fingerprint

nanotubes
electrical properties
simulation
carbon nanotubes
simulators
electric contacts
diodes
thresholds
electric potential

Keywords

  • Nanotube
  • Network
  • Percolation
  • SPICE

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Estimation of the electrical properties of random nanotube networks by SPICE simulation. / Kang, Pil Soo; Kim, Gyu-Tae.

AIP Conference Proceedings. Vol. 1399 2011. p. 787-788.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kang, PS & Kim, G-T 2011, Estimation of the electrical properties of random nanotube networks by SPICE simulation. in AIP Conference Proceedings. vol. 1399, pp. 787-788, 30th International Conference on the Physics of Semiconductors, ICPS-30, Seoul, Korea, Republic of, 10/7/25. https://doi.org/10.1063/1.3666612
Kang, Pil Soo ; Kim, Gyu-Tae. / Estimation of the electrical properties of random nanotube networks by SPICE simulation. AIP Conference Proceedings. Vol. 1399 2011. pp. 787-788
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