Evaluating skin hereditary traits based on daily activities

Jehyeok Rew, Young Hwan Choi, Daehoon Kim, Seungmin Rho, Een Jun Hwang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Skin aging can be caused by intrinsic or extrinsic factors. Typical extrinsic factors include UV exposure, lifestyle, and environmental pollution. However, the effects on skin aging differ among individuals because of differences in hereditary traits. Identification of such hereditary traits requires much time and effort. In this study, we propose a scheme for identifying personal hereditary traits by correlating skin images with daily activities. We collected skin images and information on the daily activities of subjects. Skin texture ages were calculated based on various skin texture features, and damage scores were assigned based on activity-related parameters such as activity duration and intensity. By tracing skin ages and damage scores for each activity, we ranked their influence on skin aging and defined personal skin hereditary traits based on the results of the analysis.

Original languageEnglish
Title of host publicationLecture Notes in Electrical Engineering
PublisherSpringer Verlag
Pages261-270
Number of pages10
Volume301
ISBN (Print)9789401787970
DOIs
Publication statusPublished - 2014
Event2014 FTRA International Symposium on Frontier and Innovation in Future Computing and Communications, FCC 2014 - Auckland, New Zealand
Duration: 2014 Jan 132014 Jan 16

Publication series

NameLecture Notes in Electrical Engineering
Volume301
ISSN (Print)18761100
ISSN (Electronic)18761119

Other

Other2014 FTRA International Symposium on Frontier and Innovation in Future Computing and Communications, FCC 2014
CountryNew Zealand
CityAuckland
Period14/1/1314/1/16

ASJC Scopus subject areas

  • Industrial and Manufacturing Engineering

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  • Cite this

    Rew, J., Choi, Y. H., Kim, D., Rho, S., & Hwang, E. J. (2014). Evaluating skin hereditary traits based on daily activities. In Lecture Notes in Electrical Engineering (Vol. 301, pp. 261-270). (Lecture Notes in Electrical Engineering; Vol. 301). Springer Verlag. https://doi.org/10.1007/978-94-017-8798-7_32