Abstract
We characterized the structural quality of CdTexSe1-x crystals grown by the Traveling Heater Method (THM) from a Te-rich solution using Synchrotron White Beam X-ray Diffraction Topography in the reflection mode. Structural defects were also studied by chemical etching of the crystal surfaces. The crystals were found to be fairly free from strains, and they had very few sub-grain boundaries and dislocation/sub-grain boundary networks.
Original language | English |
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Pages (from-to) | 99-102 |
Number of pages | 4 |
Journal | Journal of Crystal Growth |
Volume | 389 |
DOIs | |
Publication status | Published - 2014 Mar 1 |
Externally published | Yes |
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Keywords
- A1. Characterization
- A1. Extended defects
- A1. Sub-grain boundary network
- A2. THM
- B2. CdTeSe
- B2. Semiconducting II-VI materials
ASJC Scopus subject areas
- Condensed Matter Physics
- Materials Chemistry
- Inorganic Chemistry
Cite this
Evaluation of CdTexSe1-x crystals grown from a Te-rich solution. / Roy, U. N.; Bolotnikov, A. E.; Camarda, G. S.; Cui, Y.; Hossain, A.; Lee, Kisung; Yang, G.; James, R. B.
In: Journal of Crystal Growth, Vol. 389, 01.03.2014, p. 99-102.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Evaluation of CdTexSe1-x crystals grown from a Te-rich solution
AU - Roy, U. N.
AU - Bolotnikov, A. E.
AU - Camarda, G. S.
AU - Cui, Y.
AU - Hossain, A.
AU - Lee, Kisung
AU - Yang, G.
AU - James, R. B.
PY - 2014/3/1
Y1 - 2014/3/1
N2 - We characterized the structural quality of CdTexSe1-x crystals grown by the Traveling Heater Method (THM) from a Te-rich solution using Synchrotron White Beam X-ray Diffraction Topography in the reflection mode. Structural defects were also studied by chemical etching of the crystal surfaces. The crystals were found to be fairly free from strains, and they had very few sub-grain boundaries and dislocation/sub-grain boundary networks.
AB - We characterized the structural quality of CdTexSe1-x crystals grown by the Traveling Heater Method (THM) from a Te-rich solution using Synchrotron White Beam X-ray Diffraction Topography in the reflection mode. Structural defects were also studied by chemical etching of the crystal surfaces. The crystals were found to be fairly free from strains, and they had very few sub-grain boundaries and dislocation/sub-grain boundary networks.
KW - A1. Characterization
KW - A1. Extended defects
KW - A1. Sub-grain boundary network
KW - A2. THM
KW - B2. CdTeSe
KW - B2. Semiconducting II-VI materials
UR - http://www.scopus.com/inward/record.url?scp=84890898243&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84890898243&partnerID=8YFLogxK
U2 - 10.1016/j.jcrysgro.2013.11.074
DO - 10.1016/j.jcrysgro.2013.11.074
M3 - Article
AN - SCOPUS:84890898243
VL - 389
SP - 99
EP - 102
JO - Journal of Crystal Growth
JF - Journal of Crystal Growth
SN - 0022-0248
ER -