Evaluation of CdTexSe1-x crystals grown from a Te-rich solution

U. N. Roy, A. E. Bolotnikov, G. S. Camarda, Y. Cui, A. Hossain, Kisung Lee, G. Yang, R. B. James

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9 Citations (Scopus)

Abstract

We characterized the structural quality of CdTexSe1-x crystals grown by the Traveling Heater Method (THM) from a Te-rich solution using Synchrotron White Beam X-ray Diffraction Topography in the reflection mode. Structural defects were also studied by chemical etching of the crystal surfaces. The crystals were found to be fairly free from strains, and they had very few sub-grain boundaries and dislocation/sub-grain boundary networks.

Original languageEnglish
Pages (from-to)99-102
Number of pages4
JournalJournal of Crystal Growth
Volume389
DOIs
Publication statusPublished - 2014 Mar 1
Externally publishedYes

Keywords

  • A1. Characterization
  • A1. Extended defects
  • A1. Sub-grain boundary network
  • A2. THM
  • B2. CdTeSe
  • B2. Semiconducting II-VI materials

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Materials Chemistry
  • Inorganic Chemistry

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    Roy, U. N., Bolotnikov, A. E., Camarda, G. S., Cui, Y., Hossain, A., Lee, K., Yang, G., & James, R. B. (2014). Evaluation of CdTexSe1-x crystals grown from a Te-rich solution. Journal of Crystal Growth, 389, 99-102. https://doi.org/10.1016/j.jcrysgro.2013.11.074