Abstract
We characterized the structural quality of CdTexSe1-x crystals grown by the Traveling Heater Method (THM) from a Te-rich solution using Synchrotron White Beam X-ray Diffraction Topography in the reflection mode. Structural defects were also studied by chemical etching of the crystal surfaces. The crystals were found to be fairly free from strains, and they had very few sub-grain boundaries and dislocation/sub-grain boundary networks.
Original language | English |
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Pages (from-to) | 99-102 |
Number of pages | 4 |
Journal | Journal of Crystal Growth |
Volume | 389 |
DOIs | |
Publication status | Published - 2014 Mar 1 |
Externally published | Yes |
Keywords
- A1. Characterization
- A1. Extended defects
- A1. Sub-grain boundary network
- A2. THM
- B2. CdTeSe
- B2. Semiconducting II-VI materials
ASJC Scopus subject areas
- Condensed Matter Physics
- Inorganic Chemistry
- Materials Chemistry