Evaluation of CdTexSe1-x crystals grown from a Te-rich solution

U. N. Roy, A. E. Bolotnikov, G. S. Camarda, Y. Cui, A. Hossain, Kisung Lee, G. Yang, R. B. James

Research output: Contribution to journal › Article

9 Citations (Scopus)

Abstract

We characterized the structural quality of CdTexSe1-x crystals grown by the Traveling Heater Method (THM) from a Te-rich solution using Synchrotron White Beam X-ray Diffraction Topography in the reflection mode. Structural defects were also studied by chemical etching of the crystal surfaces. The crystals were found to be fairly free from strains, and they had very few sub-grain boundaries and dislocation/sub-grain boundary networks.

Original languageEnglish
Pages (from-to)99-102
Number of pages4
JournalJournal of Crystal Growth
Volume389
DOIs
Publication statusPublished - 2014 Mar 1
Externally publishedYes

Fingerprint

grain boundaries
Crystals
evaluation
Grain boundaries
crystal surfaces
heaters
crystals
topography
synchrotrons
etching
Synchrotrons
Dislocations (crystals)
Topography
Etching
defects
diffraction
X ray diffraction
Defects
x rays

Keywords

  • A1. Characterization
  • A1. Extended defects
  • A1. Sub-grain boundary network
  • A2. THM
  • B2. CdTeSe
  • B2. Semiconducting II-VI materials

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Materials Chemistry
  • Inorganic Chemistry

Cite this

Roy, U. N., Bolotnikov, A. E., Camarda, G. S., Cui, Y., Hossain, A., Lee, K., ... James, R. B. (2014). Evaluation of CdTexSe1-x crystals grown from a Te-rich solution. Journal of Crystal Growth, 389, 99-102. https://doi.org/10.1016/j.jcrysgro.2013.11.074

Evaluation of CdTexSe1-x crystals grown from a Te-rich solution. / Roy, U. N.; Bolotnikov, A. E.; Camarda, G. S.; Cui, Y.; Hossain, A.; Lee, Kisung; Yang, G.; James, R. B.

In: Journal of Crystal Growth, Vol. 389, 01.03.2014, p. 99-102.

Research output: Contribution to journal › Article

Roy, UN, Bolotnikov, AE, Camarda, GS, Cui, Y, Hossain, A, Lee, K, Yang, G & James, RB 2014, 'Evaluation of CdTexSe1-x crystals grown from a Te-rich solution', Journal of Crystal Growth, vol. 389, pp. 99-102. https://doi.org/10.1016/j.jcrysgro.2013.11.074
Roy UN, Bolotnikov AE, Camarda GS, Cui Y, Hossain A, Lee K et al. Evaluation of CdTexSe1-x crystals grown from a Te-rich solution. Journal of Crystal Growth. 2014 Mar 1;389:99-102. https://doi.org/10.1016/j.jcrysgro.2013.11.074
Roy, U. N. ; Bolotnikov, A. E. ; Camarda, G. S. ; Cui, Y. ; Hossain, A. ; Lee, Kisung ; Yang, G. ; James, R. B. / Evaluation of CdTexSe1-x crystals grown from a Te-rich solution. In: Journal of Crystal Growth. 2014 ; Vol. 389. pp. 99-102.
@article{c88917db59a940ae8fc9af27fd9ab54f,
title = "Evaluation of CdTexSe1-x crystals grown from a Te-rich solution",
abstract = "We characterized the structural quality of CdTexSe1-x crystals grown by the Traveling Heater Method (THM) from a Te-rich solution using Synchrotron White Beam X-ray Diffraction Topography in the reflection mode. Structural defects were also studied by chemical etching of the crystal surfaces. The crystals were found to be fairly free from strains, and they had very few sub-grain boundaries and dislocation/sub-grain boundary networks.",
keywords = "A1. Characterization, A1. Extended defects, A1. Sub-grain boundary network, A2. THM, B2. CdTeSe, B2. Semiconducting II-VI materials",
author = "Roy, {U. N.} and Bolotnikov, {A. E.} and Camarda, {G. S.} and Y. Cui and A. Hossain and Kisung Lee and G. Yang and James, {R. B.}",
year = "2014",
month = "3",
day = "1",
doi = "10.1016/j.jcrysgro.2013.11.074",
language = "English",
volume = "389",
pages = "99--102",
journal = "Journal of Crystal Growth",
issn = "0022-0248",
publisher = "Elsevier",

}

TY - JOUR

T1 - Evaluation of CdTexSe1-x crystals grown from a Te-rich solution

AU - Roy, U. N.

AU - Bolotnikov, A. E.

AU - Camarda, G. S.

AU - Cui, Y.

AU - Hossain, A.

AU - Lee, Kisung

AU - Yang, G.

AU - James, R. B.

PY - 2014/3/1

Y1 - 2014/3/1

N2 - We characterized the structural quality of CdTexSe1-x crystals grown by the Traveling Heater Method (THM) from a Te-rich solution using Synchrotron White Beam X-ray Diffraction Topography in the reflection mode. Structural defects were also studied by chemical etching of the crystal surfaces. The crystals were found to be fairly free from strains, and they had very few sub-grain boundaries and dislocation/sub-grain boundary networks.

AB - We characterized the structural quality of CdTexSe1-x crystals grown by the Traveling Heater Method (THM) from a Te-rich solution using Synchrotron White Beam X-ray Diffraction Topography in the reflection mode. Structural defects were also studied by chemical etching of the crystal surfaces. The crystals were found to be fairly free from strains, and they had very few sub-grain boundaries and dislocation/sub-grain boundary networks.

KW - A1. Characterization

KW - A1. Extended defects

KW - A1. Sub-grain boundary network

KW - A2. THM

KW - B2. CdTeSe

KW - B2. Semiconducting II-VI materials

UR - http://www.scopus.com/inward/record.url?scp=84890898243&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84890898243&partnerID=8YFLogxK

U2 - 10.1016/j.jcrysgro.2013.11.074

DO - 10.1016/j.jcrysgro.2013.11.074

M3 - Article

AN - SCOPUS:84890898243

VL - 389

SP - 99

EP - 102

JO - Journal of Crystal Growth

JF - Journal of Crystal Growth

SN - 0022-0248

ER -

Access to Document