Evaluation of potential-induced degradation in crystalline Si solar cells using Na fault injection

Wonwook Oh, Junhee Kim, Byungjun Kang, Soohyun Bae, Kyung Dong Lee, Haeseok Lee, Donghwan Kim, Sung Il Chan

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

Photovoltaic (PV) modules are exposed to high-voltage stress between grounded module frames and solar cells, a configuration called potential-induced degradation (PID). Since PID mainly depends on the solar cells used for module packaging, several steps for PID tests can be omitted. We carried out PID tests on the cell level with Na fault injection in accordance with IEC 62804 and examined the extent of PID with saturation current density (J02) extracted from I–V measurements in the dark. Na-fault injection is a reasonable means for performing PID tests on the cell level without module packaging.

Original languageEnglish
Pages (from-to)646-649
Number of pages4
JournalMicroelectronics Reliability
Volume64
DOIs
Publication statusPublished - 2016 Sep 1

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Keywords

  • Na fault injection
  • p-Type crystalline solar cells
  • Potential induced degradation
  • PV modules

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Safety, Risk, Reliability and Quality
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering

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