Evaluation of potential-induced degradation in crystalline Si solar cells using Na fault injection

Wonwook Oh; Junhee Kim; Byungjun Kang; Soohyun Bae; Kyung Dong Lee; Hae Seok Lee; Donghwan Kim; Sung Il Chan

doi:10.1016/j.microrel.2016.07.059

Evaluation of potential-induced degradation in crystalline Si solar cells using Na fault injection

Wonwook Oh, Junhee Kim, Byungjun Kang, Soohyun Bae, Kyung Dong Lee, Hae Seok Lee, Donghwan Kim, Sung Il Chan

Research output: Contribution to journal › Article › peer-review

8 Citations (Scopus)

Abstract

Photovoltaic (PV) modules are exposed to high-voltage stress between grounded module frames and solar cells, a configuration called potential-induced degradation (PID). Since PID mainly depends on the solar cells used for module packaging, several steps for PID tests can be omitted. We carried out PID tests on the cell level with Na fault injection in accordance with IEC 62804 and examined the extent of PID with saturation current density (J₀₂) extracted from I–V measurements in the dark. Na-fault injection is a reasonable means for performing PID tests on the cell level without module packaging.

Original language	English
Pages (from-to)	646-649
Number of pages	4
Journal	Microelectronics Reliability
Volume	64
DOIs	https://doi.org/10.1016/j.microrel.2016.07.059
Publication status	Published - 2016 Sept 1

Keywords

Na fault injection
PV modules
Potential induced degradation
p-Type crystalline solar cells

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Safety, Risk, Reliability and Quality
Condensed Matter Physics
Surfaces, Coatings and Films
Electrical and Electronic Engineering

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Access to Document

10.1016/j.microrel.2016.07.059

Cite this

@article{8ff4eeeec9134deb9d9b6d4142bf597c,

title = "Evaluation of potential-induced degradation in crystalline Si solar cells using Na fault injection",

abstract = "Photovoltaic (PV) modules are exposed to high-voltage stress between grounded module frames and solar cells, a configuration called potential-induced degradation (PID). Since PID mainly depends on the solar cells used for module packaging, several steps for PID tests can be omitted. We carried out PID tests on the cell level with Na fault injection in accordance with IEC 62804 and examined the extent of PID with saturation current density (J02) extracted from I–V measurements in the dark. Na-fault injection is a reasonable means for performing PID tests on the cell level without module packaging.",

keywords = "Na fault injection, PV modules, Potential induced degradation, p-Type crystalline solar cells",

author = "Wonwook Oh and Junhee Kim and Byungjun Kang and Soohyun Bae and Lee, {Kyung Dong} and Lee, {Hae Seok} and Donghwan Kim and Chan, {Sung Il}",

note = "Funding Information: This work was supported by the New & Renewable Energy (No. 20133010011770 ) of the Korea Institute of Energy Technology Evaluation and Planning (KETEP) grant funded by the Korea government Ministry of Trade, Industry and Energy . This work was supported by the Human Resources Program in Energy Technology of the Korea Institute of Energy Technology Evaluation and Planning (KETEP), granted financial resource from the Ministry of Trade, Industry & Energy, Republic of Korea (No. 20154030200760 ). Publisher Copyright: {\textcopyright} 2016 Elsevier Ltd",

year = "2016",

month = sep,

day = "1",

doi = "10.1016/j.microrel.2016.07.059",

language = "English",

volume = "64",

pages = "646--649",

journal = "Microelectronics and Reliability",

issn = "0026-2714",

publisher = "Elsevier Limited",

}

TY - JOUR

T1 - Evaluation of potential-induced degradation in crystalline Si solar cells using Na fault injection

AU - Oh, Wonwook

AU - Kim, Junhee

AU - Kang, Byungjun

AU - Bae, Soohyun

AU - Lee, Kyung Dong

AU - Lee, Hae Seok

AU - Kim, Donghwan

AU - Chan, Sung Il

N1 - Funding Information: This work was supported by the New & Renewable Energy (No. 20133010011770 ) of the Korea Institute of Energy Technology Evaluation and Planning (KETEP) grant funded by the Korea government Ministry of Trade, Industry and Energy . This work was supported by the Human Resources Program in Energy Technology of the Korea Institute of Energy Technology Evaluation and Planning (KETEP), granted financial resource from the Ministry of Trade, Industry & Energy, Republic of Korea (No. 20154030200760 ). Publisher Copyright: © 2016 Elsevier Ltd

PY - 2016/9/1

Y1 - 2016/9/1

N2 - Photovoltaic (PV) modules are exposed to high-voltage stress between grounded module frames and solar cells, a configuration called potential-induced degradation (PID). Since PID mainly depends on the solar cells used for module packaging, several steps for PID tests can be omitted. We carried out PID tests on the cell level with Na fault injection in accordance with IEC 62804 and examined the extent of PID with saturation current density (J02) extracted from I–V measurements in the dark. Na-fault injection is a reasonable means for performing PID tests on the cell level without module packaging.

AB - Photovoltaic (PV) modules are exposed to high-voltage stress between grounded module frames and solar cells, a configuration called potential-induced degradation (PID). Since PID mainly depends on the solar cells used for module packaging, several steps for PID tests can be omitted. We carried out PID tests on the cell level with Na fault injection in accordance with IEC 62804 and examined the extent of PID with saturation current density (J02) extracted from I–V measurements in the dark. Na-fault injection is a reasonable means for performing PID tests on the cell level without module packaging.

KW - Na fault injection

KW - PV modules

KW - Potential induced degradation

KW - p-Type crystalline solar cells

UR - http://www.scopus.com/inward/record.url?scp=84991738796&partnerID=8YFLogxK

U2 - 10.1016/j.microrel.2016.07.059

DO - 10.1016/j.microrel.2016.07.059

M3 - Article

AN - SCOPUS:84991738796

SN - 0026-2714

VL - 64

SP - 646

EP - 649

JO - Microelectronics and Reliability

JF - Microelectronics and Reliability

ER -

Evaluation of potential-induced degradation in crystalline Si solar cells using Na fault injection

Abstract

Keywords

ASJC Scopus subject areas

UN SDGs

Access to Document

Other files and links

Fingerprint

Cite this