A new antiferromagnetic (AF) Mn-Ir-Pt film was fabricated as an exchange-biased layer (EBL). The exchange anisotropy and micro-structures of the fabricated EBL were characterized.
|Journal||Digests of the Intermag Conference|
|Publication status||Published - 2000|
|Event||2000 IEEE International Magnetics Conference-2000 IEEE INTERMAG - Toronto, Ont, Can|
Duration: 2000 Apr 9 → 2000 Apr 13
ASJC Scopus subject areas
- Electrical and Electronic Engineering