Exchange anisotropy and thermal stability of Mn-Ir-Pt exchange-biased layers

Jae Chul Ro, Young-geun Kim, Seong Yong Yoon, Joon Hyuk Park, Dong Min Jeon, Su Jeong Suh

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

The exchange coupling and the microstructures of the Ta/(Ni-Fe, Co-Fe)/Mn-Ir-Pt/Ta multilayers have been investigated by varying the compositions of Mn-Ir-Pt film. For exchange-bias layer (EBL) comprising NiFe/CoFe/Mn79.7Ir18.4Pt1.9 structures, the exchange bias field (Hex) of 441 Oe (exchange energy Jex of 0.236 erg/cm2) and the blocking temperature (Tb) of 260°C was obtained. In addition, it is found that the Mn-Ir-Pt EBL's have the polycrystalline structure and (111) texture. The crystallographic structure of the Mn-Ir-Pt film was face centered cubic (FCC).

Original languageEnglish
Pages (from-to)2569-2571
Number of pages3
JournalIEEE Transactions on Magnetics
Volume36
Issue number5 I
DOIs
Publication statusPublished - 2000 Sep 1

Keywords

  • Exchange bias layer
  • Exchange coupling
  • Exchange energy
  • Microstructure
  • Mn-Ir-Pt

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Physics and Astronomy (miscellaneous)

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