Exploring anomalies in GAStech: VAST 2014 Mini Challenge 1 and 2

Jaegul Choo; Yi Han; Mengdie Hu; Hannah Kim; James Nugent; Francesco Poggi; Haesun Park; John Stasko

doi:10.1109/VAST.2014.7042559

Exploring anomalies in GAStech: VAST 2014 Mini Challenge 1 and 2

Jaegul Choo, Yi Han, Mengdie Hu, Hannah Kim, James Nugent, Francesco Poggi, Haesun Park, John Stasko

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

We present our process and analysis for VAST 2014 Mini Challenge 1 and 2, which integrate an off-the-shelf tool, Jigsaw, rapid web-based visualization prototyping using D3, and analytics-based visualizations using Matlab.

Original language	English
Title of host publication	2014 IEEE Conference on Visual Analytics Science and Technology, VAST 2014 - Proceedings
Editors	Min Chen, David Ebert, Chris North
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	347-348
Number of pages	2
ISBN (Electronic)	9781479962273
DOIs	https://doi.org/10.1109/VAST.2014.7042559
Publication status	Published - 2015 Feb 13
Event	2014 IEEE Conference on Visual Analytics Science and Technology, VAST 2014 - Paris, France Duration: 2014 Oct 9 → 2014 Oct 14

Publication series

Name	2014 IEEE Conference on Visual Analytics Science and Technology, VAST 2014 - Proceedings

Conference

Conference	2014 IEEE Conference on Visual Analytics Science and Technology, VAST 2014
Country/Territory	France
City	Paris
Period	14/10/9 → 14/10/14

Keywords

H.5.2 [INFORMATION INTERFACES AND PRESENTATION]: User Interfaces - Theory and methods

ASJC Scopus subject areas

Computer Vision and Pattern Recognition
Computer Science Applications

Access to Document

10.1109/VAST.2014.7042559

Cite this

Choo, J., Han, Y., Hu, M., Kim, H., Nugent, J., Poggi, F., Park, H., & Stasko, J. (2015). Exploring anomalies in GAStech: VAST 2014 Mini Challenge 1 and 2. In M. Chen, D. Ebert, & C. North (Eds.), 2014 IEEE Conference on Visual Analytics Science and Technology, VAST 2014 - Proceedings (pp. 347-348). [7042559] (2014 IEEE Conference on Visual Analytics Science and Technology, VAST 2014 - Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/VAST.2014.7042559

Exploring anomalies in GAStech : VAST 2014 Mini Challenge 1 and 2. / Choo, Jaegul; Han, Yi; Hu, Mengdie et al.

2014 IEEE Conference on Visual Analytics Science and Technology, VAST 2014 - Proceedings. ed. / Min Chen; David Ebert; Chris North. Institute of Electrical and Electronics Engineers Inc., 2015. p. 347-348 7042559 (2014 IEEE Conference on Visual Analytics Science and Technology, VAST 2014 - Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Choo, J, Han, Y, Hu, M, Kim, H, Nugent, J, Poggi, F, Park, H & Stasko, J 2015, Exploring anomalies in GAStech: VAST 2014 Mini Challenge 1 and 2. in M Chen, D Ebert & C North (eds), 2014 IEEE Conference on Visual Analytics Science and Technology, VAST 2014 - Proceedings., 7042559, 2014 IEEE Conference on Visual Analytics Science and Technology, VAST 2014 - Proceedings, Institute of Electrical and Electronics Engineers Inc., pp. 347-348, 2014 IEEE Conference on Visual Analytics Science and Technology, VAST 2014, Paris, France, 14/10/9. https://doi.org/10.1109/VAST.2014.7042559

Choo J, Han Y, Hu M, Kim H, Nugent J, Poggi F et al. Exploring anomalies in GAStech: VAST 2014 Mini Challenge 1 and 2. In Chen M, Ebert D, North C, editors, 2014 IEEE Conference on Visual Analytics Science and Technology, VAST 2014 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2015. p. 347-348. 7042559. (2014 IEEE Conference on Visual Analytics Science and Technology, VAST 2014 - Proceedings). doi: 10.1109/VAST.2014.7042559

Choo, Jaegul ; Han, Yi ; Hu, Mengdie et al. / Exploring anomalies in GAStech : VAST 2014 Mini Challenge 1 and 2. 2014 IEEE Conference on Visual Analytics Science and Technology, VAST 2014 - Proceedings. editor / Min Chen ; David Ebert ; Chris North. Institute of Electrical and Electronics Engineers Inc., 2015. pp. 347-348 (2014 IEEE Conference on Visual Analytics Science and Technology, VAST 2014 - Proceedings).

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Exploring anomalies in GAStech: VAST 2014 Mini Challenge 1 and 2

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