Extended depth of focus in tomographic phase microscopy using a propagation algorithm

Wonshik Choi, Christopher Fang-Yen, Kamran Badizadegan, Ramachandra R. Dasari, Michael S. Feld

Research output: Contribution to journalArticle

49 Citations (Scopus)

Abstract

Tomographic phase microscopy is a laser interferometry technique in which a 3D refractive index map of a biological sample is constructed from quantitative phase images collected at a set of illumination angles. Although the resulting tomographic images provide valuable information, their resolution declines at axial distances beyond about 1 μm from the focal plane. We describe an improved 3D reconstruction algorithm in which the field at the focal plane is numerically propagated to depths throughout the sample. Diffraction is thus incorporated, extending the depth of focus to more than 10 μm. Tomograms with improved focal depth are demonstrated for single HT29 cells.

Original languageEnglish
Pages (from-to)171-173
Number of pages3
JournalOptics Letters
Volume33
Issue number2
DOIs
Publication statusPublished - 2008 Jan 15
Externally publishedYes

Fingerprint

Interferometry
HT29 Cells
Refractometry
Lighting
Microscopy
Lasers
microscopy
propagation
laser interferometry
illumination
refractivity
cells
diffraction

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Extended depth of focus in tomographic phase microscopy using a propagation algorithm. / Choi, Wonshik; Fang-Yen, Christopher; Badizadegan, Kamran; Dasari, Ramachandra R.; Feld, Michael S.

In: Optics Letters, Vol. 33, No. 2, 15.01.2008, p. 171-173.

Research output: Contribution to journalArticle

Choi, Wonshik ; Fang-Yen, Christopher ; Badizadegan, Kamran ; Dasari, Ramachandra R. ; Feld, Michael S. / Extended depth of focus in tomographic phase microscopy using a propagation algorithm. In: Optics Letters. 2008 ; Vol. 33, No. 2. pp. 171-173.
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