Extraction method for 3-dimensional spacial data with electron microscope and apparatus thereof

Chil Hwan Oh (Inventor)

Research output: Patent

Abstract

전자현미경을 사용해서 물체의 3차원 공간 데이터를추출하는 방법 및 그 장치
Original languageEnglish
Patent number10329250
Publication statusPublished - 2016 Mar 3

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