Fabrication of probe-typed carbon nanotube point emitters

Seung Il Jung, Jai Seong Choi, Hyung Cheoul Shim, Soohyun Kim, Sung Ho Jo, Cheol Jin Lee

Research output: Contribution to journalArticle

40 Citations (Scopus)

Abstract

Probe-typed carbon nanotube (CNT) point emitter was fabricated by attaching single-walled CNT (SWCNT) and double-walled CNT (DWCNT) bundles onto the atomic force microscope tip using dielectrophoresis method. The field emission current from SWCNT point emitter was 4.9 μA at 750 V, which is corresponding to the emission current density of at least 1.2× 103 A cm2. The Fowler-Nordheim plots for the SWCNT and DWCNT point emitters revealed that the SWCNT bundle consists of more individual SWCNTs than DWCNT bundle and, as a result, the field emission performance of the SWCNT point emitter is better than the DWCNT point emitter. It is suggested that the probe-typed CNT point emitters can be used for microwave amplifiers and high-resolution electron-beam instruments.

Original languageEnglish
Article number233108
JournalApplied Physics Letters
Volume89
Issue number23
DOIs
Publication statusPublished - 2006 Dec 18

    Fingerprint

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Jung, S. I., Choi, J. S., Shim, H. C., Kim, S., Jo, S. H., & Lee, C. J. (2006). Fabrication of probe-typed carbon nanotube point emitters. Applied Physics Letters, 89(23), [233108]. https://doi.org/10.1063/1.2402222