Far-field Measurement of single gold nanorod scattering using total-internal-reflection illumination

Donghyeong Kim, Kwang Yong Jeong, Ho Seok Ee, Hong Kyu Park, Min Kyo Seo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We made a novel method for measuring far-field scattering distribution of single nanostructure with high signal-to-background ratio using total-internal-reflection illumination. We achieved wide measurement range by direct scanning over limit of numerical-aperture in conventional back-focal-imaging.

Original languageEnglish
Title of host publication2015 11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Volume1
ISBN (Print)9781467371094
DOIs
Publication statusPublished - 2016 Jan 7
Event11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015 - Busan, Korea, Republic of
Duration: 2015 Aug 242015 Aug 28

Other

Other11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015
CountryKorea, Republic of
CityBusan
Period15/8/2415/8/28

    Fingerprint

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics

Cite this

Kim, D., Jeong, K. Y., Ee, H. S., Park, H. K., & Seo, M. K. (2016). Far-field Measurement of single gold nanorod scattering using total-internal-reflection illumination. In 2015 11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015 (Vol. 1). [7375854] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CLEOPR.2015.7375854