Far-field scattering measurement of a single gold nanorod using total-internal-reflection illumination

Donghyeong Kim, Kwang Yong Jeong, Ho Seok Ee, Hong Kyu Park, Min Kyo Seo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We demonstrate a novel method for measuring far-field scattering of a single nanostructure with a high signal-to-background ratio using total-internal-reflection illumination. Direct far-field scanning overcomes the numerical aperture limit of the typical back-focal plane imaging.

Original languageEnglish
Title of host publicationCLEO: Science and Innovations, CLEO-SI 2015
PublisherOptical Society of America (OSA)
Pages2267
Number of pages1
ISBN (Print)9781557529688
DOIs
Publication statusPublished - 2015 May 4
EventCLEO: Science and Innovations, CLEO-SI 2015 - San Jose, United States
Duration: 2015 May 102015 May 15

Other

OtherCLEO: Science and Innovations, CLEO-SI 2015
CountryUnited States
CitySan Jose
Period15/5/1015/5/15

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics

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  • Cite this

    Kim, D., Jeong, K. Y., Ee, H. S., Park, H. K., & Seo, M. K. (2015). Far-field scattering measurement of a single gold nanorod using total-internal-reflection illumination. In CLEO: Science and Innovations, CLEO-SI 2015 (pp. 2267). Optical Society of America (OSA). https://doi.org/10.1364/CLEO_SI.2015.STh3M.2