Far-field scattering measurement of a single gold nanorod using total-internal-reflection illumination

Donghyeong Kim, Kwang Yong Jeong, Ho Seok Ee, Hong Kyu Park, Min Kyo Seo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We demonstrate a novel method for measuring far-field scattering of a single nanostructure with a high signal-to-background ratio using total-internal-reflection illumination. Direct far-field scanning overcomes the numerical aperture limit of the typical back-focal plane imaging.

Original languageEnglish
Title of host publicationConference on Lasers and Electro-Optics Europe - Technical Digest
PublisherInstitute of Electrical and Electronics Engineers Inc.
Volume2015-August
ISBN (Print)9781557529688
Publication statusPublished - 2015 Aug 10
EventConference on Lasers and Electro-Optics, CLEO 2015 - San Jose, United States
Duration: 2015 May 102015 May 15

Other

OtherConference on Lasers and Electro-Optics, CLEO 2015
CountryUnited States
CitySan Jose
Period15/5/1015/5/15

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Keywords

  • Distortion measurement
  • Glass
  • Gold
  • Imaging
  • Lighting
  • Plasmons
  • Scattering

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics
  • Electronic, Optical and Magnetic Materials

Cite this

Kim, D., Jeong, K. Y., Ee, H. S., Park, H. K., & Seo, M. K. (2015). Far-field scattering measurement of a single gold nanorod using total-internal-reflection illumination. In Conference on Lasers and Electro-Optics Europe - Technical Digest (Vol. 2015-August). [7184056] Institute of Electrical and Electronics Engineers Inc..