Abstract
We demonstrate a novel method for measuring far-field scattering of a single nanostructure with a high signal-to-background ratio using total-internal-reflection illumination. Direct far-field scanning overcomes the numerical aperture limit of the typical back-focal plane imaging.
| Original language | English |
|---|---|
| Title of host publication | Conference on Lasers and Electro-Optics Europe - Technical Digest |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Volume | 2015-August |
| ISBN (Print) | 9781557529688 |
| Publication status | Published - 2015 Aug 10 |
| Event | Conference on Lasers and Electro-Optics, CLEO 2015 - San Jose, United States Duration: 2015 May 10 → 2015 May 15 |
Other
| Other | Conference on Lasers and Electro-Optics, CLEO 2015 |
|---|---|
| Country/Territory | United States |
| City | San Jose |
| Period | 15/5/10 → 15/5/15 |
Keywords
- Distortion measurement
- Glass
- Gold
- Imaging
- Lighting
- Plasmons
- Scattering
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Atomic and Molecular Physics, and Optics
- Electronic, Optical and Magnetic Materials