Fast implementation of the basis matrix and block basis matrix representation for morphological filters

Aldo W. Morales, Sung Jea Ko, Kyung Hoon Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents a fast implementation method for grayscale function processing (FP) systems. The proposed method is based on the matrix representation of the FP system using the basis matrix (BM) and the block basis matrix (BBM). The computational efficiency derives from recursive algorithms based on some characteristics of the BM and BBM matrices. It is shown that, with the proposed scheme, both opening and closing can be determined in real time by 2N - 2 additions and 2N - 2 comparisons, and open-closing and close-opening by 4N - 4 additions and 4N - 4 comparisons, when the size of the GSE is equal to N.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsEdward R. Dougherty, Jaakko T. Astola, Harold G. Longbotham, Nasser M. Nasrabadi, Aggelos K. Katsaggelos
Pages228-239
Number of pages12
Publication statusPublished - 1995 Dec 1
Externally publishedYes
EventNonlinear Image Processing VI - San Jose, CA, USA
Duration: 1995 Feb 61995 Feb 9

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2424
ISSN (Print)0277-786X

Other

OtherNonlinear Image Processing VI
CitySan Jose, CA, USA
Period95/2/695/2/9

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Morales, A. W., Ko, S. J., & Lee, K. H. (1995). Fast implementation of the basis matrix and block basis matrix representation for morphological filters. In E. R. Dougherty, J. T. Astola, H. G. Longbotham, N. M. Nasrabadi, & A. K. Katsaggelos (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (pp. 228-239). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 2424).