Fast neutron irradiation effects in n-GaN

A. Y. Polyakov, N. B. Smirnov, A. V. Govorkov, A. V. Markov, S. J. Pearton, N. G. Kolin, D. I. Merkurisov, V. M. Boiko, Cheul Ro Lee, In-Hwan Lee

Research output: Contribution to journalArticle

47 Citations (Scopus)

Abstract

The electrical properties and deep level spectra in undoped n-GaN films irradiated by fast neutrons are reported. The electron removal rate was ∼5 cm-1, and the dominant deep states introduced by neutron damage were electron traps with activation energy of 0.75 eV. For high doses of 1.7 × 1017-1018 cm-2 the material becomes semi-insulating n-type with the Fermi level pinned near Ec-0.85 eV. Deep level spectra are dominated by electron traps with activation energy of 0.75 eV, close to the energy of the Fermi level pinning in heavily irradiated material. Neutron irradiation also introduces a high density of centers giving rise to strong persistent photocapacitance. The observed phenomena are explained under the assumption that the dominant defects in neutron irradiated GaN are disordered regions produced by high-energy recoil atoms.

Original languageEnglish
Pages (from-to)436-442
Number of pages7
JournalJournal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Volume25
Issue number2
DOIs
Publication statusPublished - 2007 Apr 8
Externally publishedYes

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Neutron irradiation
neutron irradiation
fast neutrons
Electron traps
Neutrons
Fermi level
Activation energy
traps
recoil atoms
activation energy
neutrons
electrons
Electric properties
Atoms
Defects
Electrons
electrical properties
damage
dosage
energy

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

Polyakov, A. Y., Smirnov, N. B., Govorkov, A. V., Markov, A. V., Pearton, S. J., Kolin, N. G., ... Lee, I-H. (2007). Fast neutron irradiation effects in n-GaN. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 25(2), 436-442. https://doi.org/10.1116/1.2713406

Fast neutron irradiation effects in n-GaN. / Polyakov, A. Y.; Smirnov, N. B.; Govorkov, A. V.; Markov, A. V.; Pearton, S. J.; Kolin, N. G.; Merkurisov, D. I.; Boiko, V. M.; Lee, Cheul Ro; Lee, In-Hwan.

In: Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, Vol. 25, No. 2, 08.04.2007, p. 436-442.

Research output: Contribution to journalArticle

Polyakov, AY, Smirnov, NB, Govorkov, AV, Markov, AV, Pearton, SJ, Kolin, NG, Merkurisov, DI, Boiko, VM, Lee, CR & Lee, I-H 2007, 'Fast neutron irradiation effects in n-GaN', Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, vol. 25, no. 2, pp. 436-442. https://doi.org/10.1116/1.2713406
Polyakov AY, Smirnov NB, Govorkov AV, Markov AV, Pearton SJ, Kolin NG et al. Fast neutron irradiation effects in n-GaN. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 2007 Apr 8;25(2):436-442. https://doi.org/10.1116/1.2713406
Polyakov, A. Y. ; Smirnov, N. B. ; Govorkov, A. V. ; Markov, A. V. ; Pearton, S. J. ; Kolin, N. G. ; Merkurisov, D. I. ; Boiko, V. M. ; Lee, Cheul Ro ; Lee, In-Hwan. / Fast neutron irradiation effects in n-GaN. In: Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 2007 ; Vol. 25, No. 2. pp. 436-442.
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