Fatigue crack growth analysis of an interfacial crack in heterogeneous materials using homogenized XIGA

G. Bhardwaj; S. K. Singh; I. V. Singh; B. K. Mishra; Timon Rabczuk

doi:10.1016/j.tafmec.2016.04.004

Fatigue crack growth analysis of an interfacial crack in heterogeneous materials using homogenized XIGA

G. Bhardwaj, S. K. Singh, I. V. Singh, B. K. Mishra, Timon Rabczuk

Research output: Contribution to journal › Article › peer-review

41 Citations (Scopus)

Abstract

In this work, the fatigue life of an interfacial cracked plate is evaluated in the presence of flaws by homogenized extended isogeometric analysis (XIGA). In XIGA, the crack faces are modeled by discontinuous Heaviside jump functions, whereas the singularity in the stress field at the crack tip is modeled by crack tip enrichment functions. Holes and inclusions are modeled by Heaviside function and distance function respectively. The discontinuities are modeled in a selected region near the major crack whereas the region away from the crack is modeled by an equivalent homogeneous material. The stress intensity factors (SIFs) for the interface cracks are numerically evaluated using the domain based interaction integral approach. Paris law of fatigue crack growth is employed for computing the fatigue life of an interfacial cracked plate. The results show that the defects/ discontinuities away from the main crack barely influence the fatigue life.

Original language	English
Pages (from-to)	294-319
Number of pages	26
Journal	Theoretical and Applied Fracture Mechanics
Volume	85
DOIs	https://doi.org/10.1016/j.tafmec.2016.04.004
Publication status	Published - 2016 Oct 1
Externally published	Yes

Keywords

Fatigue life
Holes
Homogenized XIGA
Inclusions
Interfacial cracks

ASJC Scopus subject areas

Materials Science(all)
Condensed Matter Physics
Mechanical Engineering
Applied Mathematics

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title = "Fatigue crack growth analysis of an interfacial crack in heterogeneous materials using homogenized XIGA",

abstract = "In this work, the fatigue life of an interfacial cracked plate is evaluated in the presence of flaws by homogenized extended isogeometric analysis (XIGA). In XIGA, the crack faces are modeled by discontinuous Heaviside jump functions, whereas the singularity in the stress field at the crack tip is modeled by crack tip enrichment functions. Holes and inclusions are modeled by Heaviside function and distance function respectively. The discontinuities are modeled in a selected region near the major crack whereas the region away from the crack is modeled by an equivalent homogeneous material. The stress intensity factors (SIFs) for the interface cracks are numerically evaluated using the domain based interaction integral approach. Paris law of fatigue crack growth is employed for computing the fatigue life of an interfacial cracked plate. The results show that the defects/ discontinuities away from the main crack barely influence the fatigue life.",

keywords = "Fatigue life, Holes, Homogenized XIGA, Inclusions, Interfacial cracks",

author = "G. Bhardwaj and Singh, {S. K.} and Singh, {I. V.} and Mishra, {B. K.} and Timon Rabczuk",

note = "Funding Information: Authors would like to thank Science and Engineering Research Board (SERB), Department of Science and Technology (DST), New Delhi, India for providing financial support to this work through Grant No: SR/S3/MMER/0105/2013 . Publisher Copyright: {\textcopyright} 2016 Elsevier Ltd Copyright: Copyright 2016 Elsevier B.V., All rights reserved.",

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doi = "10.1016/j.tafmec.2016.04.004",

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AU - Bhardwaj, G.

AU - Singh, S. K.

AU - Singh, I. V.

AU - Mishra, B. K.

AU - Rabczuk, Timon

N1 - Funding Information: Authors would like to thank Science and Engineering Research Board (SERB), Department of Science and Technology (DST), New Delhi, India for providing financial support to this work through Grant No: SR/S3/MMER/0105/2013 . Publisher Copyright: © 2016 Elsevier Ltd Copyright: Copyright 2016 Elsevier B.V., All rights reserved.

PY - 2016/10/1

Y1 - 2016/10/1

N2 - In this work, the fatigue life of an interfacial cracked plate is evaluated in the presence of flaws by homogenized extended isogeometric analysis (XIGA). In XIGA, the crack faces are modeled by discontinuous Heaviside jump functions, whereas the singularity in the stress field at the crack tip is modeled by crack tip enrichment functions. Holes and inclusions are modeled by Heaviside function and distance function respectively. The discontinuities are modeled in a selected region near the major crack whereas the region away from the crack is modeled by an equivalent homogeneous material. The stress intensity factors (SIFs) for the interface cracks are numerically evaluated using the domain based interaction integral approach. Paris law of fatigue crack growth is employed for computing the fatigue life of an interfacial cracked plate. The results show that the defects/ discontinuities away from the main crack barely influence the fatigue life.

AB - In this work, the fatigue life of an interfacial cracked plate is evaluated in the presence of flaws by homogenized extended isogeometric analysis (XIGA). In XIGA, the crack faces are modeled by discontinuous Heaviside jump functions, whereas the singularity in the stress field at the crack tip is modeled by crack tip enrichment functions. Holes and inclusions are modeled by Heaviside function and distance function respectively. The discontinuities are modeled in a selected region near the major crack whereas the region away from the crack is modeled by an equivalent homogeneous material. The stress intensity factors (SIFs) for the interface cracks are numerically evaluated using the domain based interaction integral approach. Paris law of fatigue crack growth is employed for computing the fatigue life of an interfacial cracked plate. The results show that the defects/ discontinuities away from the main crack barely influence the fatigue life.

KW - Fatigue life

KW - Holes

KW - Homogenized XIGA

KW - Inclusions

KW - Interfacial cracks

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Fatigue crack growth analysis of an interfacial crack in heterogeneous materials using homogenized XIGA

Abstract

Keywords

ASJC Scopus subject areas

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