Fatigue life prediction of multiple site damage based on probabilistic equivalent initial flaw model

JungHoon Kim, Goangseup Zi, Son Nguyen Van, MinChul Jeong, Jun g Sik Kong, Minsung Kim

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

The loss of strength in a structure as a result of cyclic loads over a period of life time is an important phenomenon for the life-cycle analysis. Service loads are accentuated at the areas of stress concentration, mainly at the connection of components. Structural components unavoidably are affected by defects such as surface scratches, surface roughness and weld defects of random sizes, which usually occur during the manufacturing and handling process. These defects are shown to have an important effect on the fatigue life of the structural components by promoting crack initiation sites. The value of equivalent initial flaw size (EIFS) is calculated by using the back extrapolation technique and the Paris law of fatigue crack growth from results of fatigue tests. We try to analyze the effect of EIFS distribution in a multiple site damage (MSD) specimen by using the extended finite element method (XFEM). For the analysis, fatigue tests were conducted on the centrally-cracked specimens and MSD specimens.

Original languageEnglish
Pages (from-to)443-457
Number of pages15
JournalStructural Engineering and Mechanics
Volume38
Issue number4
Publication statusPublished - 2011 May 25

Keywords

  • Back extrapolation
  • Equivalent initial flaw size
  • Extended finite element method
  • Fatigue life prediction
  • Multiple site damage

ASJC Scopus subject areas

  • Civil and Structural Engineering
  • Building and Construction
  • Mechanical Engineering
  • Mechanics of Materials

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