FBRNN: Feedback recurrent neural network for extreme image super-resolution

Junyeop Lee, Jaihyun Park, Kanghyu Lee, Jeongki Min, Gwantae Kim, Bokyeung Lee, Bonhwa Ku, David K. Han, Hanseok Ko

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Single image extreme Super Resolution (SR) is a difficult task as scale factor in the order of 10X or greater is typically attempted. For instance, in the case of 16x upscale of an image, a single pixel from a low resolution image gets expanded to a 16x16 image patch. Such attempts often result fuzzy quality and loss in details in reconstructed images. To handle these difficulties, we propose a network architecture composed of a series of connected blocks in recurrent and feedback fashions for enhanced SR reconstruction. By use of recurrent network, an SR image is refined over a sequence of enhancement stages in coarse to fine manner. Additionally, each stage involves back projection of SR image to LR images for continuously being refined during the sequence. According to the preliminary results of NTIRE 2020 Perceptual Extreme SR challenge, our team (KU-ISPLB) secured 6th place by PSNR and 7th place by SSIM among all participants.

Original languageEnglish
Title of host publicationProceedings - 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2020
PublisherIEEE Computer Society
Pages2021-2028
Number of pages8
ISBN (Electronic)9781728193601
DOIs
Publication statusPublished - 2020 Jun
Event2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2020 - Virtual, Online, United States
Duration: 2020 Jun 142020 Jun 19

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
Volume2020-June
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2020
CountryUnited States
CityVirtual, Online
Period20/6/1420/6/19

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Electrical and Electronic Engineering

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