Fine-grain voltage tuned cache architecture for yield management under process variations

Joonho Kong, Yan Pan, Serkan Ozdemir, Anitha Mohan, Gokhan Memik, Sung Woo Chung

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Fingerprint Dive into the research topics of 'Fine-grain voltage tuned cache architecture for yield management under process variations'. Together they form a unique fingerprint.

Engineering & Materials Science