Flexible and transparent TiO<inf>2</inf>/Ag/ITO multilayer electrodes on PET substrates for organic photonic devices

Dae Hyun Kim, Jun Ho Kim, Han Kyeol Lee, Jin Young Na, Sun Kyung Kim, Jeong Hwan Lee, Sang Woo Kim, Young Zo Yoo, Tae Yeon Seong

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

We report on the formation of highly flexible and transparent TiO<inf>2</inf>/Ag/ITO multilayer films deposited on polyethylene terephthalate substrates. The optical and electrical properties of the multilayer films were investigated as a function of oxide thickness. The transmission window gradually shifted toward lower energies with increasing oxide thickness. The TiO<inf>2</inf> (40 nm)/Ag (18 nm)/ITO (40 nm) films gave the transmittance of 93.1% at 560 nm. The relationship between transmittance and oxide thickness was simulated using the scattering matrix method to understand high transmittance. As the oxide thickness increased from 20 to 50 nm, the carrier concentration gradually decreased from 1.08 × 10<sup>22</sup> to 6.66 × 10<sup>21</sup> cm<sup>-3</sup>, while the sheet resistance varied from 5.8 to 6.1 Ω/sq. Haacke's figure of merit reached a maximum at 40 nm and then decreased with increasing oxide thickness. The change in resistance for the 60 nm-thick ITO single film rapidly increased with increasing bending cycles, while that of the TiO<inf>2</inf>/Ag/ITO (40 nm/18 nm/40 nm) film remained virtually unchanged during the bending test.

Original languageEnglish
Pages (from-to)1593-1598
Number of pages6
JournalJournal of Materials Research
Volume30
Issue number10
DOIs
Publication statusPublished - 2015 May 21

Fingerprint

Photonic devices
ITO (semiconductors)
Oxides
Multilayers
photonics
Electrodes
electrodes
oxides
Substrates
transmittance
Multilayer films
Polyethylene Terephthalates
Sheet resistance
polyethylene terephthalate
Bending tests
S matrix theory
figure of merit
matrix methods
Polyethylene terephthalates
Carrier concentration

ASJC Scopus subject areas

  • Materials Science(all)
  • Mechanical Engineering
  • Mechanics of Materials
  • Condensed Matter Physics

Cite this

Flexible and transparent TiO<inf>2</inf>/Ag/ITO multilayer electrodes on PET substrates for organic photonic devices. / Kim, Dae Hyun; Kim, Jun Ho; Lee, Han Kyeol; Na, Jin Young; Kim, Sun Kyung; Lee, Jeong Hwan; Kim, Sang Woo; Yoo, Young Zo; Seong, Tae Yeon.

In: Journal of Materials Research, Vol. 30, No. 10, 21.05.2015, p. 1593-1598.

Research output: Contribution to journalArticle

Kim, Dae Hyun ; Kim, Jun Ho ; Lee, Han Kyeol ; Na, Jin Young ; Kim, Sun Kyung ; Lee, Jeong Hwan ; Kim, Sang Woo ; Yoo, Young Zo ; Seong, Tae Yeon. / Flexible and transparent TiO<inf>2</inf>/Ag/ITO multilayer electrodes on PET substrates for organic photonic devices. In: Journal of Materials Research. 2015 ; Vol. 30, No. 10. pp. 1593-1598.
@article{3c5733fb2dfa45e29a4cc7ce1865393b,
title = "Flexible and transparent TiO2/Ag/ITO multilayer electrodes on PET substrates for organic photonic devices",
abstract = "We report on the formation of highly flexible and transparent TiO2/Ag/ITO multilayer films deposited on polyethylene terephthalate substrates. The optical and electrical properties of the multilayer films were investigated as a function of oxide thickness. The transmission window gradually shifted toward lower energies with increasing oxide thickness. The TiO2 (40 nm)/Ag (18 nm)/ITO (40 nm) films gave the transmittance of 93.1{\%} at 560 nm. The relationship between transmittance and oxide thickness was simulated using the scattering matrix method to understand high transmittance. As the oxide thickness increased from 20 to 50 nm, the carrier concentration gradually decreased from 1.08 × 1022 to 6.66 × 1021 cm-3, while the sheet resistance varied from 5.8 to 6.1 Ω/sq. Haacke's figure of merit reached a maximum at 40 nm and then decreased with increasing oxide thickness. The change in resistance for the 60 nm-thick ITO single film rapidly increased with increasing bending cycles, while that of the TiO2/Ag/ITO (40 nm/18 nm/40 nm) film remained virtually unchanged during the bending test.",
author = "Kim, {Dae Hyun} and Kim, {Jun Ho} and Lee, {Han Kyeol} and Na, {Jin Young} and Kim, {Sun Kyung} and Lee, {Jeong Hwan} and Kim, {Sang Woo} and Yoo, {Young Zo} and Seong, {Tae Yeon}",
year = "2015",
month = "5",
day = "21",
doi = "10.1557/jmr.2015.100",
language = "English",
volume = "30",
pages = "1593--1598",
journal = "Journal of Materials Research",
issn = "0884-2914",
publisher = "Materials Research Society",
number = "10",

}

TY - JOUR

T1 - Flexible and transparent TiO2/Ag/ITO multilayer electrodes on PET substrates for organic photonic devices

AU - Kim, Dae Hyun

AU - Kim, Jun Ho

AU - Lee, Han Kyeol

AU - Na, Jin Young

AU - Kim, Sun Kyung

AU - Lee, Jeong Hwan

AU - Kim, Sang Woo

AU - Yoo, Young Zo

AU - Seong, Tae Yeon

PY - 2015/5/21

Y1 - 2015/5/21

N2 - We report on the formation of highly flexible and transparent TiO2/Ag/ITO multilayer films deposited on polyethylene terephthalate substrates. The optical and electrical properties of the multilayer films were investigated as a function of oxide thickness. The transmission window gradually shifted toward lower energies with increasing oxide thickness. The TiO2 (40 nm)/Ag (18 nm)/ITO (40 nm) films gave the transmittance of 93.1% at 560 nm. The relationship between transmittance and oxide thickness was simulated using the scattering matrix method to understand high transmittance. As the oxide thickness increased from 20 to 50 nm, the carrier concentration gradually decreased from 1.08 × 1022 to 6.66 × 1021 cm-3, while the sheet resistance varied from 5.8 to 6.1 Ω/sq. Haacke's figure of merit reached a maximum at 40 nm and then decreased with increasing oxide thickness. The change in resistance for the 60 nm-thick ITO single film rapidly increased with increasing bending cycles, while that of the TiO2/Ag/ITO (40 nm/18 nm/40 nm) film remained virtually unchanged during the bending test.

AB - We report on the formation of highly flexible and transparent TiO2/Ag/ITO multilayer films deposited on polyethylene terephthalate substrates. The optical and electrical properties of the multilayer films were investigated as a function of oxide thickness. The transmission window gradually shifted toward lower energies with increasing oxide thickness. The TiO2 (40 nm)/Ag (18 nm)/ITO (40 nm) films gave the transmittance of 93.1% at 560 nm. The relationship between transmittance and oxide thickness was simulated using the scattering matrix method to understand high transmittance. As the oxide thickness increased from 20 to 50 nm, the carrier concentration gradually decreased from 1.08 × 1022 to 6.66 × 1021 cm-3, while the sheet resistance varied from 5.8 to 6.1 Ω/sq. Haacke's figure of merit reached a maximum at 40 nm and then decreased with increasing oxide thickness. The change in resistance for the 60 nm-thick ITO single film rapidly increased with increasing bending cycles, while that of the TiO2/Ag/ITO (40 nm/18 nm/40 nm) film remained virtually unchanged during the bending test.

UR - http://www.scopus.com/inward/record.url?scp=84929710605&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84929710605&partnerID=8YFLogxK

U2 - 10.1557/jmr.2015.100

DO - 10.1557/jmr.2015.100

M3 - Article

VL - 30

SP - 1593

EP - 1598

JO - Journal of Materials Research

JF - Journal of Materials Research

SN - 0884-2914

IS - 10

ER -