Abstract
The electrical characteristics of a flexible nano-floating-gate memory (NFGM) device with a channel made of an enhancement-mode n +-p-n + Si nanowire (Si-NW) are investigated in this work. The NFGM based on the enhancement-mode Si-NW field-effect transistor is constructed on a plastic substrate with a Pt-nanocrystal floating-gate layer; it exhibits an on-current/off-current ratio of 10 7 and a subthreshold swing of 88 mV/dec. The NFGM shows good memory characteristics and mechanical flexibility, such as a threshold voltage shift of 1.85 V, a retention time of up to 10 4s, and a stability for up to 1000 bending cycles. The present study demonstrates the promising potential of flexible Si-NW-based nonvolatile memories for future electronics.
Original language | English |
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Article number | 6294439 |
Pages (from-to) | 2939-2942 |
Number of pages | 4 |
Journal | IEEE Transactions on Electron Devices |
Volume | 59 |
Issue number | 11 |
DOIs | |
Publication status | Published - 2012 |
Keywords
- Field-effect transistor (FET)
- Pt
- memory
- nanocrystal (NC)
- nonvolatile
- plastic substrate
- silicon-nanowire (Si-NW) array
- top-down approach
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering