Fluorescence X-ray computed tomography using CdTe detector array

Changyeon Yoon, Won Ho Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This research involved a 3D simulation of a non-destructive test by detecting fluorescence X-ray with a position sensitive CdTe detector. Simulations proceeded in various conditions such as different types of phantoms. All simulations were based on fluorescence X-ray computed tomography (FXCT) by using the Monte Carlo method. In general, conventional Computed Tomography (CT) analyzes materials based on attenuation coefficients and is highly dependent on the densities of the material, hence, it can be difficult to discriminate similar density materials even if their atomic numbers differ. In this research, the material was exposed to an X-ray and the characteristic X-ray was measured using a 2D CdTe planar detector array to reconstruct the 3D image. Since atoms have their own characteristic X-ray energy, our system was even able to discriminate materials of the same density if the materials are composed of different atomic numbers.

Original languageEnglish
Title of host publicationIEEE Nuclear Science Symposium Conference Record
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781479905348
DOIs
Publication statusPublished - 2013 Jan 1
Event2013 60th IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013 - Seoul, Korea, Republic of
Duration: 2013 Oct 272013 Nov 2

Other

Other2013 60th IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013
CountryKorea, Republic of
CitySeoul
Period13/10/2713/11/2

Fingerprint

X Ray Computed Tomography
tomography
Fluorescence
X-Rays
fluorescence
detectors
x rays
Monte Carlo Method
nondestructive tests
Research
simulation
attenuation coefficients
Tomography
Monte Carlo method
atoms

ASJC Scopus subject areas

  • Radiation
  • Nuclear and High Energy Physics
  • Radiology Nuclear Medicine and imaging

Cite this

Yoon, C., & Lee, W. H. (2013). Fluorescence X-ray computed tomography using CdTe detector array. In IEEE Nuclear Science Symposium Conference Record [6829822] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/NSSMIC.2013.6829822

Fluorescence X-ray computed tomography using CdTe detector array. / Yoon, Changyeon; Lee, Won Ho.

IEEE Nuclear Science Symposium Conference Record. Institute of Electrical and Electronics Engineers Inc., 2013. 6829822.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Yoon, C & Lee, WH 2013, Fluorescence X-ray computed tomography using CdTe detector array. in IEEE Nuclear Science Symposium Conference Record., 6829822, Institute of Electrical and Electronics Engineers Inc., 2013 60th IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013, Seoul, Korea, Republic of, 13/10/27. https://doi.org/10.1109/NSSMIC.2013.6829822
Yoon C, Lee WH. Fluorescence X-ray computed tomography using CdTe detector array. In IEEE Nuclear Science Symposium Conference Record. Institute of Electrical and Electronics Engineers Inc. 2013. 6829822 https://doi.org/10.1109/NSSMIC.2013.6829822
Yoon, Changyeon ; Lee, Won Ho. / Fluorescence X-ray computed tomography using CdTe detector array. IEEE Nuclear Science Symposium Conference Record. Institute of Electrical and Electronics Engineers Inc., 2013.
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