We demonstrate how force detection methods based on atomic force microscopy can be used to measure displacement in micromechanical devices. We show the operation of a simple microfabricated accelerometer, the proof mass of which incorporates a tip which can be moved towards an opposing surface. Both noncontact operation using long range electrostatic forces and tapping mode operation are demonstrated. The displacement sensitivity of the present device using feedback to control the tip-surface separation is approximately 1 nm.
|Number of pages||3|
|Journal||Applied Physics Letters|
|Publication status||Published - 2001 Jun 18|
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)