FTIR spectroscopy of buried interfaces in molecular junctions

Yongseok Jun, X. Y. Zhu

Research output: Contribution to journalArticle

46 Citations (Scopus)

Abstract

We demonstrate that ATR-FTIR spectroscopy can be used to record high-quality vibrational spectra of molecules at buried interfaces in metal-molecule-silicon and metal-molecule-metal junctions. This provides quantitative information on the structure and conformation of molecules at buried interfaces, an issue of critical importance to molecular electronics. In the model systems of Au on octadecyltrichlorosilane self-assembled monolayer on Si or mecaptohexadecanoic acid multilayers on Au-covered Si, ATR-FTIR suggests that metal deposition leads to not only conformational disorder within the film but also the direct interaction of metal atoms/clusters with alkyl backbones.

Original languageEnglish
Pages (from-to)13224-13225
Number of pages2
JournalJournal of the American Chemical Society
Volume126
Issue number41
DOIs
Publication statusPublished - 2004 Oct 20
Externally publishedYes

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Fourier Transform Infrared Spectroscopy
Spectrum Analysis
Metals
Spectroscopy
Molecules
Molecular electronics
Self assembled monolayers
Vibrational spectra
Silicon
Conformations
Multilayers
Atoms
Acids

ASJC Scopus subject areas

  • Catalysis
  • Chemistry(all)
  • Biochemistry
  • Colloid and Surface Chemistry

Cite this

FTIR spectroscopy of buried interfaces in molecular junctions. / Jun, Yongseok; Zhu, X. Y.

In: Journal of the American Chemical Society, Vol. 126, No. 41, 20.10.2004, p. 13224-13225.

Research output: Contribution to journalArticle

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